Skip to main content
Log in

Wiring fault detection with Boolean-chaos time-domain reflectometry

  • Original Paper
  • Published:
Nonlinear Dynamics Aims and scope Submit manuscript

Abstract

We experimentally demonstrate a time-domain reflectometry (TDR) method for detecting cable faults, which employs a Boolean circuit to generate a wideband chaotic waveform acting as probe signal and further locates faults by correlating a duplicate of the probe signal and the back-reflected signal. The Boolean circuit is a small delayed-feedback system mainly consisting of two exclusive-OR (XOR) gates and one exclusive-NOR gate. Benefiting from fast response and high operating voltage of logical gates, the Boolean circuit can achieve a high-bandwidth and large-amplitude output which cause a high resolution and a long measurable distance for the TDR. Our experimental results show that a 2 km detection distance of a breakpoint and a \(\sim \)0.1 m spatial resolution can be achieved by means of a chaotic signal from the Boolean circuit with 533 MHz bandwidth and 2.5 V amplitude. Furthermore, we experimentally demonstrate the detection of short circuits and impedance mismatches can be successfully implemented using our method.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Fig. 1
Fig. 2
Fig. 3
Fig. 4
Fig. 5
Fig. 6
Fig. 7

Similar content being viewed by others

References

  1. Furse, C., Chung, Y.C., Lo, C., Pendayala, P.: A critical comparison of reflectometry methods for location of wiring faults. Smart Struct. Syst. 2, 25–46 (2006)

  2. Wiring Integrity Research (WIRE) Pilot Study A0SP-0001-XB1, NASA (2000)

  3. Review of federal programs for wire system safety: National Science and Technology Council. White House, Final Report (2000)

  4. Mackay, N.A.M., Penstone, S.R.: A high-sensitivity narrow-band time-domain reflectometer. IEEE Trans. Instrum. 23, 155–158 (1974)

    Article  Google Scholar 

  5. Paulter, N.: Long-term repeatability of a TDR-based printed wiring board dielectric constant measurement system. IEEE Trans. Instrum. Meas. 47, 1469–1473 (1998)

    Article  Google Scholar 

  6. Sharma, C.R., Furse, C., Harrison, R.R.: Low-power STDR CMOS sensor for locating faults in aging aircraft wiring. IEEE Sens. J. 7, 43–50 (2007)

    Article  Google Scholar 

  7. Smith, P., Furse, C., Gunther, J.: Analysis of spread spectrum time domain reflectometry for wire fault location. IEEE Sens. J. 5, 1469–1478 (2005)

    Article  Google Scholar 

  8. Furse, C., Smith, P., Safavi, M., Lo, C.: Feasibility of spread spectrum sensors for location of arcs on live wires. IEEE Sens. J. 5, 1445–1450 (2005)

    Article  Google Scholar 

  9. Wang, A.B., Zhang, M.J., Xu, H., Wang, Y.C.: Location of wire faults using chaotic signal. IEEE Electron Device Lett. 32, 372–374 (2011)

    Article  Google Scholar 

  10. Uchida, A., Heil, T., Liu, Y., Davis, P., Aida, T.: High-frequency broad-band signal generation using a semiconductor laser with a chaotic optical injection. IEEE J. Quantum Electron. 39, 1462–1467 (2003)

    Article  Google Scholar 

  11. Lin, F.Y., Liu, J.M.: Chaotic radar using nonlinear laser dynamics. IEEE J. Quantum Electron. 40, 815–820 (2004)

    Article  Google Scholar 

  12. Wu, Y., Wang, Y.C., Li, P., Wang, A.B., Zhang, M.J.: Can fixed time delay signature be concealed in chaotic semiconductor laser with optical feedback? IEEE J. Quantum Electron. 48, 1371–1379 (2012)

    Article  Google Scholar 

  13. Zhang, R., Cavalcante, H.L.D.S., Gao, Z., Gauthier, D.J., Socolar, J.E., Adams, M.M., Lathrop, D.P.: Boolean chaos. Phys. Rev. E 80, 045202 (2009)

    Article  Google Scholar 

  14. Cavalcante, H.L.D.S., Gauthier, D.J., Socolar, J.E., Zhang, R.: On the origin of chaos in autonomous Boolean networks. Philos. Trans. R. Soc. Lond. Ser. A 368, 495–513 (2010)

    Article  MATH  MathSciNet  Google Scholar 

  15. Lin, F.Y., Liu, J.M.: Nonlinear dynamical characteristics of an optically injected semiconductor laser subject to optoelectronic feedback. Opt. Commun. 221, 173–180 (2003)

    Article  Google Scholar 

Download references

Acknowledgments

The authors would like to thank all reviewers for their helpful comments and suggestions on this manuscript. This work was partially funded by the National Natural Science Foundation of China (Grant Nos. 61227016, 61240017, 61205142, 51404165), the Natural Science Foundation for Young Scientists of Shanxi Province (Grant Nos. 2012021013-2, 2012021011-4) and the Natural Science Foundation of Shanxi Province (Grant No. 2013011019-3).

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Jing Xia Li.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Zhang, J.G., Xu, H., Wang, B.J. et al. Wiring fault detection with Boolean-chaos time-domain reflectometry. Nonlinear Dyn 80, 553–559 (2015). https://doi.org/10.1007/s11071-014-1888-x

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s11071-014-1888-x

Keywords

Navigation