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Isothermal physical aging characterization of Polyether-ether-ketone (PEEK) and Polyphenylene sulfide (PPS) films by creep and stress relaxation

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Abstract

This paper considers the experimental characterization of isothermal physical aging of PEEK and PPS films using a dynamic mechanical analyzer. Using the short-term test method established by Struik, momentary creep and stress relaxation curves were measured at several temperatures within 15–35°C below the glass transition temperature (T g ) at various aging times. Stress and strain levels were such that the materials remained in the linear viscoelastic regime. These curves were then shifted together to determine momentary master curves and shift rates using the PHYAGE program. In order to validate the obtained isothermal physical aging behavior, the results of creep and stress relaxation testing were compared and shown to be consistent with one another using appropriate interconversion of the viscoelastic material functions. Time–temperature superposition of the master curves was also performed. The temperature shift factors and aging shift rates for both PEEK and PPS were consistent for both creep and stress relaxation test results.

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  1. Department of Mechanical Engineering, J.B. Speed School of Engineering, University of Louisville, Louisville, KY, 40292, USA

    Yunlong Guo & Roger D. Bradshaw

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  1. Yunlong Guo
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  2. Roger D. Bradshaw
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Correspondence to Roger D. Bradshaw.

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Guo, Y., Bradshaw, R.D. Isothermal physical aging characterization of Polyether-ether-ketone (PEEK) and Polyphenylene sulfide (PPS) films by creep and stress relaxation. Mech Time-Depend Mater 11, 61–89 (2007). https://doi.org/10.1007/s11043-007-9032-7

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  • DOI: https://doi.org/10.1007/s11043-007-9032-7

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