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Molecular mapping of leaf rust resistance gene LrBi16 in Chinese wheat cultivar Bimai 16

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Abstract

Leaf rust, caused by Puccinia triticina, is one of the most widespread diseases in common wheat (Triticum aestivum L.) globally. With the objective of identifying and mapping new genes for resistance to leaf rust, F1, F2 plants and F3 lines from a cross between resistant cultivar Bimai 16 and susceptible cultivar Thatcher were inoculated with Chinese Puccinia triticina pathotypes FHTT and PHTS in the greenhouse. In the first seedling test, Bimai 16, Thatcher, 20 F1 plants, 359 F2 plants and 298 F3 lines were inoculated with pathotype FHTT. A set of 1,255 simple sequence repeat (SSR) primer pairs were used to test the parents, and resistant and susceptible bulks. Seven polymorphic markers on chromosome 7BL were used for genotyping the F2 and F3 populations. The results indicated that Bimai 16 carried a single dominant resistance gene, temporarily designated LrBi16, closely linked to SSR markers Xcfa2257 and Xgwm344, with genetic distances of 2.8 and 2.9 cM, respectively. In the second seedling test, two dominant resistance genes were identified in Bimai 16 based on seedling reactions of 254 F2 plants inoculated with pathotype PHTS. One of the genes was LrBi16, and the other was likely to be LrZH84, which is located in chromosome 1BL. The seedling reaction pattern of plants with LrBi16 was different from that of the Thatcher lines, with Lr14a and Lr14b located on chromosome 7BL. It was concluded that LrBi16 is likely to be a new leaf rust resistance gene.

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Acknowledgments

The authors are grateful to Prof. R. A. McIntosh for critical review of this manuscript. The project was supported by National Natural Science Foundation of China (30700505 and 30971772) and National Scientific and Technical Supporting Programs funded by Ministry of Science & Technology of China (2006BAD08A05).

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Authors and Affiliations

  1. Department of Plant Pathology, College of Plant Protection, Hebei Agricultural University, Biological Control Centre for Plant Diseases and Plant Pests of Hebei, 289 Lingyusi Street, Baoding, 071001, Hebei, China

    Hai Zhang, Xing Li, Zaifeng Li & Daqun Liu

  2. Institute of Crop Science, National Wheat Improvement Center/The National Key Facility for Crop Gene Resources and Genetic Improvement, Chinese Academy of Agricultural Sciences (CAAS), 12 Zhongguancun South Street, Beijing, 100081, China

    Xianchun Xia & Zhonghu He

  3. International Maize and Wheat Improvement Center (CIMMYT) China Office, c/o CAAS, 12 Zhongguancun South Street, Beijing, 100081, China

    Zhonghu He

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  1. Hai Zhang
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  2. Xianchun Xia
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  3. Zhonghu He
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  4. Xing Li
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  5. Zaifeng Li
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Correspondence to Zaifeng Li or Daqun Liu.

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Zhang, H., Xia, X., He, Z. et al. Molecular mapping of leaf rust resistance gene LrBi16 in Chinese wheat cultivar Bimai 16. Mol Breeding 28, 527–534 (2011). https://doi.org/10.1007/s11032-010-9501-6

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  • DOI: https://doi.org/10.1007/s11032-010-9501-6

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