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QTL analysis for resistance to Soybean dwarf virus in Indonesian soybean cultivar Wilis

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Abstract

Soybean dwarf virus (SbDV), a member of the Luteoviridae family, causes serious yield losses in soybean production in northern Japan. We previously found that an Indonesian soybean cv. Wilis had a high level of resistance to SbDV. Although Wilis is infected by SbDV, symptoms are always mild and develop considerably later compared with many susceptible cultivars. To identify the resistance gene(s) to SbDV in Wilis in a quantitative trait loci (QTL) analysis, we used 71 recombinant inbred lines derived from a cross between Wilis and the susceptible Japanese cv. Toyokomachi and a set of published simple sequence repeat (SSR) markers. The SbDV resistance in Wilis was mainly controlled by a single QTL located near the SSR marker Sat_271 on the linkage group A1. This QTL accounted for 79% of the phenotypic variance.

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Abbreviations

BYDV:

Barley yellow dwarf virus

LRS:

Likelihood ratio statistics

PLRV:

Potato leafroll virus

PSP:

Percentage of symptomatic plants

QTL:

Quantitative trait loci

RI:

Recombinant inbred

SbDV:

Soybean dwarf virus

SIM:

Simple interval mapping

SSR:

Simple sequence repeat

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Authors and Affiliations

  1. Graduate School of Agriculture, Hokkaido University, Sapporo, 060-8589, Japan

    Atsushi Uchibori, Tsuyoshi Inukai & Chikara Masuta

  2. Hokkaido Central Agricultural Experiment Station, Naganuma, 069-1395, Japan

    Jun Sasaki, Toru Takeuchi, Motokazu Kamiya & Akiko Tazawa

Authors
  1. Atsushi Uchibori
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  2. Jun Sasaki
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  3. Toru Takeuchi
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  4. Motokazu Kamiya
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  5. Akiko Tazawa
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  6. Tsuyoshi Inukai
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  7. Chikara Masuta
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Corresponding author

Correspondence to Chikara Masuta.

Additional information

A. Uchibori and J. Sasaki equally contributed to this work.

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Uchibori, A., Sasaki, J., Takeuchi, T. et al. QTL analysis for resistance to Soybean dwarf virus in Indonesian soybean cultivar Wilis. Mol Breeding 23, 323–328 (2009). https://doi.org/10.1007/s11032-008-9238-7

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  • DOI: https://doi.org/10.1007/s11032-008-9238-7

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