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Development of an STS marker tightly linked to Yr26 against wheat stripe rust using the resistance gene-analog polymorphism (RGAP) technique

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Abstract

The gene Yr26 confers resistance to all races of Puccinia striiformis f. sp. tritici (PST), the casual pathogen of wheat stripe rust in China. Here, we report development of a molecular marker closely linked to Yr26 using a resistance gene-analog polymorphism (RGAP) technique. A total of 787 F2 plants and 165 F3 lines derived from the cross Chuanmai 42/Taichung 29 were used for linkage analysis. Eighteen near-isogenic lines (NILs) and 18 Chinese wheat cultivars and advanced lines with different genes for stripe rust resistance were employed for the validation of STS markers. A total of 1,711 RGAP primer combinations were used to test the parents and resistant and susceptible bulks. Five polymorphic RGAP markers were used for genotyping all F2 plants. Linkage analysis showed that the five RGAP markers were closely linked to Yr26 with genetic distances ranging from 0.5 to 2.9 cM. These markers were then converted into STS markers, one, CYS-5, of which was located 0.5 cM to Yr26 and was closely associated with the resistance gene when validated over 18 NILs and 18 Chinese wheat cultivars and lines. The results indicated that CYS-5 can be used in marker-assisted selection targeted at pyramiding Yr26 and other genes for stripe rust resistance.

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Acknowledgements

The authors are very grateful for the critical review of this manuscript by Prof. R. A. McIntosh, Plant Breeding Institute, University of Sydney. This study was supported by the National Science Foundation of China (30471083 and 30671294), and National 863 Programs (2006AA10Z1A7 and 2006AA100102).

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Authors and Affiliations

  1. Institute of Crop Science, National Wheat Improvement Centre, The National Key Facility for Crop Gene Resources and Genetic Improvement, Chinese Academy of Agricultural Sciences (CAAS), 12 Zhongguancun South Street, Beijing, 100081, China

    W. E. Wen, G. Q. Li, Z. H. He & X. C. Xia

  2. College of Agronomy and Biotechnology, China Agricultural University, 2 Yuanmingyuan West Road, Beijing, 100094, China

    W. E. Wen, G. Q. Li & M. L. Xu

  3. International Maize and Wheat Improvement Centre (CIMMYT) China Office, c/o CAAS, 12 Zhongguancun South Street, Beijing, 100081, China

    Z. H. He

  4. Crop Research Institute, Sichuan Academy of Agricultural Sciences, 20 Jingjusi Street, Chengdu, 610066, Sichuan, China

    W. Y. Yang

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  1. W. E. Wen
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  2. G. Q. Li
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  3. Z. H. He
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  4. W. Y. Yang
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  5. M. L. Xu
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  6. X. C. Xia
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Correspondence to Z. H. He or X. C. Xia.

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Wen, W.E., Li, G.Q., He, Z.H. et al. Development of an STS marker tightly linked to Yr26 against wheat stripe rust using the resistance gene-analog polymorphism (RGAP) technique. Mol Breeding 22, 507–515 (2008). https://doi.org/10.1007/s11032-008-9194-2

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  • DOI: https://doi.org/10.1007/s11032-008-9194-2

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