Abstract
This article considers a method for measuring the surface microrelief parameters of machine parts via optoelectronic and computer means, which is an integral part of the technological process of manufacturing machine parts with precision surfaces. This method is based on the computer processing of images of studied microreliefs, considered as a set of implementations of a stationary random process. The number of implementations of this process is assumed to be equal to the number of lines in the analyzed microrelief image. The microrelief image is considered a matrix of random numbers. For this matrix, mathematical expectations, variances, standard deviations, correlation moments, and the normalized autocorrelation coefficient for the matrix columns were calculated. To evaluate the proposed method, an optical-electronic complex was used, comprising an instrumental microscope with a video camera and a computer for digital processing of the obtained microrelief images of reference samples with different roughness. The surface roughness Ra was estimated using standard methods on a profilometer ranging from 0.025 µm to 0.13 µm. For correlation-spectral image processing, software was created in C++ using OpenCV tools. The results established that the parameters of the studied microreliefs largely determine the nature of the correlation functions. To identify the studied microreliefs, we determined the analytical dependencies of Ra on the average value of the variable component of the autocorrelation function and on its spectral density values. It has been established that the most promising optoelectronic approach to measuring the Ra of microrelief is to use the spectral density of its autocorrelation function, calculated from its halftone image. The results for the surface microrelief parameters of the inner ring raceways of instrument bearings are presented. These results are relevant for noncontact measurements of the roughness of industrial products in various branches of mechanical engineering.
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Notes
GOST 2789-73. Surface Roughness. Parameters and Characteristics.
GOST 25142-82. Surface Roughness. Terms and Definitions.
GOST R ISO 4287-2014. Geometrical Product Specifications (GPS). Surface Structure. Profile Method. Terms, Definitions, and Parameters of Surface Structure.
GOST R ISO 25178-2-2014. Geometrical Product Specifications (GPS). Surface Structure. Area. Part 2. Terms, Definitions, and Surface Structure Parameters.
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Translated from Izmeritel’naya Tekhnika, No. 9, pp. 31–37, September, 2023. Russian https://doi.org/10.32446/0368-1025it.2023-9-31-37
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Original article submitted March 10, 2023. Original article reviewed August 10, 2023. Original article accepted August 11, 2023
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Abramov, A.D. Correlation-spectral method for measuring the microrelief parameters of precision surfaces of industrial products. Meas Tech 66, 671–678 (2023). https://doi.org/10.1007/s11018-024-02280-7
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DOI: https://doi.org/10.1007/s11018-024-02280-7