Skip to main content
Log in

Resistors C5–60 in Metrological Practice: Operational Experience

  • ELECTROMAGNETIC MEASUREMENTS
  • Published:
Measurement Techniques Aims and scope

The search for new types of resistors that could potentially be used for long–term storage of electrical resistance values with the highest attainable accuracy has always been an urgent task of metrology. In this paper, we have studied the problem of choosing a resistor for transmitting and storing a unit of electrical resistance when creating an Ω standard based on the quantum Hall effect in the time interval between reproductions of a unit. The choice of C5–60 resistors, which were not originally intended for use as standards of higher levels of the electrical resistance verification circuit, is substantiated. In 1990–2022 detailed experimental studies, including studies of long–term stability, of C5–60 type resistors have been carried out. Some of the investigated resistors are included in the State secondary standard of electrical resistance unit in the range of values from 0.1 Ω to 13 kΩ based on the quantum Hall effect. Comparisons of the investigated resistors with resistance measures traditionally used to create standards for the unit of electrical resistance are carried out. It has been established that C5–60 resistors have a low temperature coefficient of resistance, they are easy to stabilize using a thermostat without a temperature–controlled oil bath. The long–term stability of the C5–60 resistors turned out to be uniquely high and allows these resistors to be used as discharge standards for storing a unit of electrical resistance.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Fig. 1.
Fig. 2.
Fig. 3.

Similar content being viewed by others

Notes

  1. Resistors. Handbook. Radio i Svyaz. Moscow, 1991, 528 p.

  2. Order of the Federal Agency for Technical Regulation and Metrology dated December 30, 2019 No. 3456 “On approval of the state verification scheme for measuring instruments for electrical resistance of direct and alternating current.”

References

  1. K. Von Klitzing, G. Dorda, and M. Pepper, Phys. Rev. Lett., 45, No. 6, 494–497 (1980), https://doi.org/10.1103/PhysRevLett.45.4942.

    Article  ADS  Google Scholar 

  2. K. Von Klitzing, T. Chakraborty, P. Kim, et al., Nat. Rev. Phys., 2(8), 397–401 (2020), https://doi.org/10.1038/s42254-020-0209-1.

    Article  Google Scholar 

  3. V. M. Pudalov, S. G. Semenchinskii, and I. Ya. Krasnopolin, Meas. Tech., 31, No. 3, 195–199 (1988), https://doi.org/10.1007/BF00865075.

    Article  Google Scholar 

  4. V. M. Pudalov, and S. G. Semenchinskii, Soviet Phys. Usp., 31, No. 9, 880–881 (1988), https://doi.org/10.1070/2FPU1988v031n09ABEH005627.

    Article  ADS  Google Scholar 

  5. B. N. Taylor, 6th IEEE Conf. Record., Instrumentation and Measurement Technology Conference, Wash., DC, USA, 1989, pp. 175–177, https://doi.org/10.1109/IMTC.1989.36846.

  6. D. B. Newell et al., Metrologia, 55, L13–L16 (2018), https://doi.org/10.1088/1681-7575/aa950a.

    Article  Google Scholar 

  7. D. Newell and E. Tiesinga, The International System of Units (SI), 2019 Edition, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD [online], https://doi.org/10.6028/NIST.SP.330-2019 (Accessed April 11, 2023).

  8. V. M. Pudalov and S. G. Semenchinsky, EEE Trans. Instrum. Meas., April, 40, No. 2, 243–244 (1991), https://doi.org/10.1109/TIM.1990.1032928.

  9. A. D. Inglis, EEE Trans. Instrum. Meas., 48, No. 2, 289–292 (1999), https://doi.org/10.1109/19.769585.

    Article  ADS  Google Scholar 

  10. R. A. Watson et al., Properties and Selection: Nonferrous Alloys and Special–Purpose Materials, 2, 1328 (1990), https://doi.org/10.31399/asm.hb.v02.a00010.

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to S. G. Semenchinskiy.

Ethics declarations

Conflict of interest.

The author declare no conflict of interest.

Additional information

Translated from Izmeritel’naya Tekhnika, No. 5, pp. 47–51, May, 2023. https://doi.org/10.32446/0368-1025it.2023-5-47-51.

Rights and permissions

Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Semenchinskiy, S.G. Resistors C5–60 in Metrological Practice: Operational Experience. Meas Tech 66, 343–348 (2023). https://doi.org/10.1007/s11018-023-02233-6

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s11018-023-02233-6

Keywords

Navigation