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Influence of the Surface Curvature of Silicon Reference Materials on their Structural Characteristics

  • LINEAR AND ANGULAR MEASUREMENTS
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Measurement Techniques Aims and scope

This article discusses the aspects of four-circle diffractometers that are used to identify the composition of substances and materials and to determine many mechanical, physicochemical, and biological functionally significant characteristics of substances at the arbitration level. When monitoring the operation and certification of diffractometers, a system of reference materials of diffraction properties, including the reference materials of the crystal lattice parameter, is used. Taking into account the new quantum reality of modern technologies, the characteristics of these reference samples (RSs) have been refined. According to the precision measurement results of the unit cell size of RSs of silicon’s diffraction properties, a change in its structural characteristics with a change in the sphere diameter of the samples was revealed. This size effect, detected for the first time in the millimeter range, is similar to the effect when changing the size of silicon nanoparticles and other substances with different types of chemical bonding of atoms. Hence, the size effect must be taken into account when certifying RSs used in testing four-circle diffractometers. The results are important for understanding the nanoconditions of matter and will be useful in various industries, such as robot engineering, solar energy, focusing laser beams, and developing navigation systems.

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  1. All-Russian Research Institute for Metrological Service (VNIIMS), Moscow, Russia

    B. N. Kodess

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Correspondence to B. N. Kodess.

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Translated from Izmeritel’naya Tekhnika, No. 5, pp. 35-41, May, 2022.

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Kodess, B.N. Influence of the Surface Curvature of Silicon Reference Materials on their Structural Characteristics. Meas Tech 65, 346–351 (2022). https://doi.org/10.1007/s11018-022-02086-5

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  • DOI: https://doi.org/10.1007/s11018-022-02086-5

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