The method for calibrating a coaxial-stripline contact device is improved. Transfer of the measurement planes for the S-parameters of active components at microwave frequencies is ensured, for example, for transistors from a coaxial measurement line of the analyzer to a micro-stripline. This improvement is important for the design of micro-stripline devices for various purposes based on measured S-parameters.
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References
S. M. Nikulin and A. I. Torgovanov, Sensors and Systems, No. 4 (191), 14–18 (2015).
S. V. Savel’kaev, S. V. Romas’ko, V. A. Litovchenko, and N. V. Zarzecka , J. Russ. Univ. Radioelectr., No. 1, 63–74 (2017).
S. V. Savel’kaev, Measur. Techn., No. 48, 515–519 (2005), https://doi.org/10.1007/s11018-005-0176-z.
V. P. Petrov and S. V. Savel’kaev, SU Patent No. 1478156, Byull. Izobret., No. 17 (1989).
H. Heuermann and B. Schiek, IEEE T. Microwave Theory Techn., 45, No. 3, 408–413 (1997), https://doi.org/10.1109/22.563340.
C. Wan, B. Nauwelaers, D. Schreurs, et al., IEEE T. Microwave Theory Techn., 46, No. 9, 1318–1320 (1998), https://doi.org/10.1109/22.709480.
N. H. Zhu, IEEE T. Microwave Theory Techn., 47, No. 10, 1917–1922 (1999), https://doi.org/10.1109/22.795064.
L. Chen, C. Zhang, T. J. Reck, et al., IEEE T. Microwave Theory Techn., 60, No. 9, 2894–2902 (2012), https://doi.org/10.1109/TMTT.2012.2205016.
J. Hanning, J. Stenarcon. K. Yhland. et al., IEEE T. Terahertz Sci. Technol., 4, No. 5, 582–587 (2014), https://doi.org/10.1109/TTHZ.2014.2342497.
V. I. Evseev, E. A. Lebedeva, S. M. Nikulin, et al., Sensors and Systems, No. 6 (204), 23–27 (2016).
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Translated from Metrologiya, No. 2, pp. 20–30, April–June, 2021.
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Savel’kaev, S.V. Improvement of the Calibration Process for Coaxial-Stripline Contact Devices. Meas Tech 64, 506–510 (2021). https://doi.org/10.1007/s11018-021-01960-y
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DOI: https://doi.org/10.1007/s11018-021-01960-y