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Procedural Measurement Error in Specular Reflection Coefficient from Planar Samples Using Two Different Types of Test Stands

  • RADIO MEASUREMENTS
  • Published:
Measurement Techniques Aims and scope

We discuss two methods for measuring the bistatic scattering characteristics of 2D samples of various materials. Experiments and numerical simulations were performed to determine the specular reflection coefficient as a function of wave angle of incidence for a 2D sample of material using a bistatic experimental design (in which the receiving and transmitting antennas rotate) as well as a monostatic design using a dihedral corner reflector (in which the object rotates). The characteristics of a flat magnetodielectric sample were measured at the ITAE RAS using two test stands and an appropriate experimental design. The procedural measurement errors were determined by performing numerical simulations of measurements to determine the specular reflection coefficient of the test specimen; these simulations were performed using the FEKO software and integral equations (solved using the method of moments) following two experimental designs. The results were compared with one another and with the results from calculations of the specular reflection coefficient performed in closed form using the Fresnel formulas under the assumption of an infinite flat layer of material. These calculations enabled comparison of the procedural measurement errors in the reflection coefficient determined using the two aforementioned experimental designs. The corner-reflector measurements were shown to have 1–2 dB higher procedural measurement error (deviation from the calculation in closed form) than the measurements using a bistatic test stand. The experimental results are consistent with the numerical simulations. The conclusions reached in this paper are valid with respect to any experimental facilities for studying 2D materials.

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Authors and Affiliations

  1. Moscow Institute of Physics and Technology, Dolgoprudny, Moscow Region, Russia

    R. V. Gilmutdinov & N. L. Menshikh

  2. Institute of Theoretical and Applied Electrodynamics, Russian Academy of Sciences, Moscow, Russia

    I. I. Krasnolobov, N. L. Menshikh & S. A. Fedorov

Authors
  1. R. V. Gilmutdinov
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  2. I. I. Krasnolobov
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  3. N. L. Menshikh
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  4. S. A. Fedorov
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Corresponding authors

Correspondence to R. V. Gilmutdinov or I. I. Krasnolobov.

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Translated from Izmeritel’naya Tekhnika, No. 6, pp. 44–50, June, 2021.

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Gilmutdinov, R.V., Krasnolobov, I.I., Menshikh, N.L. et al. Procedural Measurement Error in Specular Reflection Coefficient from Planar Samples Using Two Different Types of Test Stands. Meas Tech 64, 481–487 (2021). https://doi.org/10.1007/s11018-021-01957-7

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  • DOI: https://doi.org/10.1007/s11018-021-01957-7

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