Skip to main content
Log in

Measurement of the Length of Objects on Scanning Probe Microscope Images Using Curvature Detectors

  • NANOMETROLOGY
  • Published:
Measurement Techniques Aims and scope

The problem of the automatic detection of the longitudinal dimensions of objects on images obtained from microscope sounding is examined. Solution of this problem can be brought about in the field of production monitoring of materials and products of microelectronics and nanotechnology. Comparison was done of existing tools for measuring the length of objects on a test image containing geometric figures with known dimensions. A description is given of the advantages of measuring the lengths of objects directly on a halftone image by means of generating the frame of an object by a software detector of surface curvature, particularly the Circle two-dimensional detector program, based on analysis of the curvature of line and column profilograms of the raster image. Curvature is estimated by the area of a figure that is bounded by the profilogram on a particular interval. the features of measuring the length of objects by means of generating the structure from the local maxima of curvature are considered. It is shown that the curvature detector makes it possible to determine more precisely the length of objects with superimposed contours and a significant range of luminosity. the algorithms for operation of a detector that generates the structure of the object and determines its length are presented. the results of studies that confirm the feasibility of the proposed algorithms are given. Comparative analysis with existing tools for measuring lengths, carried out on images of the domains of a magnetic disk and nanopolymer fibers, has shown the proper operation of the detector in selecting the structure of the object and measuring its length.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Fig. 1.
Fig. 2.
Fig. 3.

Similar content being viewed by others

References

  1. P. V. Gulyaev, E. Yu. Shelkovnikov, A. V. Tyurikov, et al., “Features of the use of surface curvature detectors for analysis of the dimensions of nanoparticles,” Khim. Fiz. Mezosk., 15, No. 1, 138–143 (2013).

  2. P. Sh. Geidarov, “An algorithm for determining the placement and dimensions of objects based on analysis of images of objects,” Komp. Optika, 35, No. 2, 275–280 (2011).

  3. P. V. Gulyaev, “ Using bench marks for coordinate link to the surface in scanning sounding microscopy,” Komp. Optika, 44, No. 3, 470–476 (2020), https://doi.org/10.18287/2412-6179-CO-641.

    Google Scholar 

  4. Kh. S. Israfi lov, “Research on methods of binarization of images,” Vestn. Nauki Obraz., No. 6, 43–50 (2017).

  5. B. V. Bardin, V. V. Manoilov, I. V. Chubinskii-Nadezhdin, et al., “Determining the dimensions of local images of objects in order to identify them,” Nauch. Priborostr., 20, No. 3, 88–94 (2010).

    Google Scholar 

  6. O. V. Tsvetkov and L. V. Tananykina, “A method of preliminary coding of images in correlative extremal systems,” Komp. Optika, 39, No. 5, 738–743 (2015), https://doi.org/10.18287/0134-2452-2015-39-5-738-743.

    Article  ADS  Google Scholar 

  7. R. Gonzalez and R. Woods, Digital Image Processing, Pearson Education (2008), 3rd ed.

  8. A. N. Karkishchenko, A. E. Lepskii, and A. V. Bezuglov, “One method of vector and analytical presentation of the contour of an image,” Izv. TRTU, 8, No. 2, 107–111 (1998).

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to P. V. Gulyaev.

Additional information

Translated from Izmeritel’naya Tekhnika, No. 1, pp. 21–26, January, 2021.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Gulyaev, P.V. Measurement of the Length of Objects on Scanning Probe Microscope Images Using Curvature Detectors. Meas Tech 64, 21–27 (2021). https://doi.org/10.1007/s11018-021-01890-9

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s11018-021-01890-9

Keywords

Navigation