A highly sensitive device for measuring the parameters of transverse energy distribution in a beam of infrared radiation is described as part of an automated system of the synthesis of dynamic and static infrared images. The system is designed to monitor the characteristics of matrix photoreceivers in the spectrum of 2.5–4.6 μm at irradiation levels in the range of 10–9–10–5 W/сm2. The device is subject to periodic graduation and verification of the movement accuracy of the Foucault knife line at two coordinates. Measurements using the device were performed following the state and industry standards of the Russian Federation. The scan error for each coordinate did not exceed 1 μm. The device measured the function of energy concentration and the energy concentration coefficient in the formed image plane in the working spectral and dynamic ranges of the system.
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10 July 2021
A Correction to this paper has been published: https://doi.org/10.1007/s11018-021-01911-7
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Translated from Izmeritel’naya Tekhnika, No. 2, pp. 33–37, February, 2020.
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Verhoglyad, A.G., Elesin, A.G., Vedernikov, V.M. et al. Calibration of Transverse Energy Distribution Parameters in a Beam of Infrared Radiation Using a Highly Sensitive Measurement Device. Meas Tech 63, 111–116 (2020). https://doi.org/10.1007/s11018-020-01758-4
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DOI: https://doi.org/10.1007/s11018-020-01758-4