Implementations of the variational method in transformer bridges with inductively coupled arms and in logometric bridges based on an operational amplifier with high amplification factor are described. It is shown that through the use of the variational method in transformer bridges it is possible to eliminate the influence of the basic error sources – impedances in connecting cables and transformer windings – and, in logometric bridges, by means of this method, eliminate the effect of the finite amplification factor of the operational amplifier and its input impedance on the measurement results. Theoretical and experimental investigations have shown that the measurement error may be reduced 100- and 1000-fold through the use of the variational method. Metrological data from impedance meters developed with the use of variational methods are presented.
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M. N. Surdu, “Variational method of calibration of impedance meters. Part 1. Basic assumptions,” Metrologiya, No. 2, 37–53 (2019).
Sh. Awan, B. Kibble, and J. Schurr, “Coaxial electrical circuits for interference free measurements,” Inst. Engineering and Technology. London (2011), Online resource: IET Electrical Measurement Series, 13.
K. B. Karandeeva, Transformer Measurement Bridges, Energiya, Moscow (1970).
F. B. Grinevich, Automatic Alternating Current Bridges, USSR Academy of Sciences, Novosibirsk Division (1964).
V. Yu. Kneller, Yu. R. Agamalov, and A. A. Desova, Automatic Meters of Complex Quantities with Coordinated Balancing, Energiya, Moscow (1975).
M. N. Surdu, A. L. Lameko, L. N. Semenycheva, et al., “Automatic wide-band transformer bridge for measurement of capacitance and loss tangent,” Izmer. Tekhn., No. 9, 54–57 (2013).
F. Overney and B. Jeanneret, “Impedance bridges: from Wheatstone to Josephson,” Metrologia, 55, No. 5, 119–134 (2018).
K. Maeda and Y. Narimatsu, “Multi-frequency LCR meter test components under realistic conditions,” Hewlett-Packard J., 30, No. 2, 24–32 (1979).
H. P. Hall, Patent 4,196,475 US, “Method of and apparatus for automatic measurements of impedance or other parameters with microprocessor calculation techniques,” fi led Sept. 2, 1976, issued April 1, 1980.
Agilent Impedance Measurement Handbook. A Guide to Measurement Technology and Techniques, Keysight Technologies (2013), 6th ed., https://literature.edn.keysight.com/litweb/pdf/5950-3000.pdf, acc. 11.20.2018.
F. B. Karandeev, F. B. Grinevich, and A. B. Grokhol’skiy, High-Speed Electronic Compensation Measurement Devices, Energiya, Moscow (1978).
M. N. Surdu, A. L. Lameko, and A. Ye. Labuzov, “High-precision RLC meter,” Izmer. Tekhn., No. 9, 54–57 (2010).
M. N. Surdu, A. L. Lameko, and A. Panich, “Improvement of the accuracy of the logometric impedance meters in wide frequency range,” in: 15th Int. Congr. of Metrology: Digest, Paris (2011).
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Translated from Metrologiya, No. 2, pp. 44–60, April–June, 2019.
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Surdu, M.N. Variational Method of Calibration of Impedance Meters. Part 2. Implementation of Method. Meas Tech 62, 570–577 (2019). https://doi.org/10.1007/s11018-019-01662-6
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DOI: https://doi.org/10.1007/s11018-019-01662-6