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Correlational Nonlinear Optical Femtosecond Laser Profilometer with Micrometer Spatial Resolution

  • OPTOPHYSICAL MEASUREMENTS
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Measurement Techniques Aims and scope

A new femtosecond correlation nonlinear optical profilometer with micron spatial resolution is proposed, in order to increase the measurement accuracy of the heterogeneity profile of a surface at a distance up to 1 km. The principle of operation of this profilometer is based on determining the distance to the scanned object by measuring the time interval between sequences of the base (probing) and reflected femtosecond laser pulses. Thereafter, the profile of a rough surface is reestablished by using the one-dimensional spatial distribution of second-harmonic radiation as the space-time coupling of the sequences of the probing and reflected pulses in a nonlinear crystal is restored. It was shown that the spatial resolution of the profilometer is no greater than 5 μm.

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Authors and Affiliations

  1. National Institute of Metrology, Erevan, Republic of Armenia

    D. L. Hovhannisyan, A. O. Vardanyan & S. R. Melikyan

  2. All-Russia Research Institute of Optophysical Measurements (VNIIOFI), Moscow, Russia

    K. B. Savkin & S. V. Tikhomirov

  3. Erevan State University, Erevan, Republic of Armenia

    G. D. Hovhannisyan

Authors
  1. D. L. Hovhannisyan
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  2. A. O. Vardanyan
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  3. S. R. Melikyan
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  4. K. B. Savkin
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  5. S. V. Tikhomirov
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  6. G. D. Hovhannisyan
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Additional information

Translated from Izmeritel’naya Tekhnika, No. 8, pp. 29–33, August, 2017.

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Hovhannisyan, D.L., Vardanyan, A.O., Melikyan, S.R. et al. Correlational Nonlinear Optical Femtosecond Laser Profilometer with Micrometer Spatial Resolution. Meas Tech 60, 794–800 (2017). https://doi.org/10.1007/s11018-017-1272-6

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  • DOI: https://doi.org/10.1007/s11018-017-1272-6

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