A method is described for estimating spatial and temporal noise levels in phase patterns obtained using a shearing interference microscope. Experimental results are presented for a microscope operating with a coherent laser and low-coherence LED light.
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Translated from Izmeritel’naya Tekhnika, No. 11, pp. 38–40, November, 2015.
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Latushko, M.I. Noise Level Estimation in Phase Images Obtained Using a Shearing Interference Microscope. Meas Tech 58, 1234–1237 (2016). https://doi.org/10.1007/s11018-016-0876-6
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DOI: https://doi.org/10.1007/s11018-016-0876-6