Skip to main content
SpringerLink
Log in

The Determination of the Effective Radius of the Tip of the Probe of an Atomic Force Microscope Using Monodispersed Silicon Oxide Nanoparticles

  • Published:
Measurement Techniques Aims and scope

A method of constructing samples of a monodispersed ensemble of spherical particles of silicon oxide with a diameter of 26.6 ± 3.5 nm, distributed uniformly on the surface of a single-crystal silicon substrate of area 1 cm2 with a mean particle surface density of about 0.5 particles/μm2 is developed. The use of the test structure obtained to determine the effective radius of the tip of the probe of a scanning atomic-force microscope is demonstrated.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Fig. 1
Fig. 2
Fig. 3

Similar content being viewed by others

References

  1. V. P. Gavrilenko et al., “The first Russian standards in nanotechnology,” Izv. Ross. Akad. Nauk. Ser. Fiz., 73, No. 4, 454-462 (2009).

    Google Scholar 

  2. P. A. Todua, Nanometrology – a key section of the nanotechnology infrastructure, Trudy MFTI, 3, No. 4, 81-96 (2011).

    Google Scholar 

  3. A. V. Latyshev and A. L. Aseev, Monatomic Steps on the Surface of Silicon [in Russian], Izd. SO RAN, Novosibirsk (2006).

    Google Scholar 

  4. Z. G. Zeng et al., A simple method for AFM tip characterization by polystyrene spheres, Ultramicroscopy, 108, No. 9, 975-980 (2008).

    Article  Google Scholar 

  5. S. Xu and M. F. Arnsdorf, “Calibration of the scanning (atomic) force microscope with gold particles,” J. Microscopy, 173, 199-210 (1994).

    Article  Google Scholar 

  6. E. Yu. Shelkovnikov et al., “The use of parallel calculations to increase the quality of reconstruction of SFM images,” Khim. Fiz. Mezoskopiya, 13, No. 1, 135-139 (2011).

    Google Scholar 

  7. F. Zenhausern et al., “DNA and RNA imaged by scanning force microscopy: influence of molecular-scale friction,” Scanning, 14, 212-217 (1992).

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Moscow Institute of Physics and Technology (MFTI), Dolgoprudnyi, Russia

    A. A. Efimov, V. V. Ivanov, S. V. Lisovskii & M. A. Ermakova

  2. Metrological Center of RUSNANO, Dolgoprudnyi, Russia

    I. A. Volkov & A. A. Lizunova

Authors
  1. A. A. Efimov
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. V. V. Ivanov
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. I. A. Volkov
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. A. A. Lizunova
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. S. V. Lisovskii
    View author publications

    You can also search for this author in PubMed Google Scholar

  6. M. A. Ermakova
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to A. A. Efimov.

Additional information

Translated from Metrologiya, No. 10, pp. 32–37, October, 2013.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Efimov, A.A., Ivanov, V.V., Volkov, I.A. et al. The Determination of the Effective Radius of the Tip of the Probe of an Atomic Force Microscope Using Monodispersed Silicon Oxide Nanoparticles. Meas Tech 56, 1343–1346 (2014). https://doi.org/10.1007/s11018-014-0379-2

Download citation

  • Received:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s11018-014-0379-2

Keywords

Search

Navigation