Certified reference materials of the thickness of bilayers of Langmuir–Blodgett lead stearate PbSt2 films on a quartz substrate and methods of calibration of small-angle x-ray diffractors with the use of the films are developed.
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The study was carried out with the financial support of the Ministry of Education and Science of the Russian Federation (State Contract No. 14.518.11.7027) with the use of equipment of the time-sharing center of the Moscow Institute of Physics and Technology, the time-sharing center of the Shubnikov Institute of Crystallography, and one-of-a-kind equipment of the National Research Center Kurchatov Institute.
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Translated from Izmeritel’naya Tekhnika, No. 9, pp. 27–31, September, 2013.
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Avilov, A.S., Baturin, A.S., Volkov, V.V. et al. Development of Certified Reference Materials and Methods of Calibration of Small-Angle X-Ray Diffractometers for Certification and Standardization of Articles Produced by Nanoindustry. Meas Tech 56, 992–998 (2013). https://doi.org/10.1007/s11018-013-0318-7
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DOI: https://doi.org/10.1007/s11018-013-0318-7