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Measurement Techniques

, Volume 54, Issue 12, pp 1365–1371 | Cite as

Combined Diophantine approximations and the analysis of the accuracy of multi-wavelength interferometers

  • A. V. Zabelin
Optophysical Measurements

A geometrical method of interpreting the method of exact fractions, used in multi-wavelength interferometry, is considered. Using the example of two-wavelength and three-wavelength interferometers, it is shown how one can redefine the mathematical model of the coincidence method in order to use it to calculate the error due to the finite accuracy of the exact fractions and of the measuring wavelengths. A relation between the theoretical-numerical problems of the combined Diophantine approximations and the problem of calculating the parameters of the method is indicated.

Keywords

multi-wavelength interferometry method of exact fractions number geometry combined Diophantine approximations 

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Copyright information

© Springer Science+Business Media, Inc. 2012

Authors and Affiliations

  1. 1.Stankin Moscow State Technological UniversityMoscowRussia

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