The features and principles of traditional linear technical measurements and nanometrology are examined. It is shown that traditional technical measurements fully support the requirements of and interchangeability for modern manufacturing with an extensive array of measurement means over wide measurement ranges. Nanometrology serves only for measurement of very small objects in science and in the production of microchips and new materials with the aid of special microscopes based on different physical principles.
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References
ISO 286-2–88, System of Tolerances and Fits.
GOST 25347–82, Tolerance Fields and Recommended Fits.
ISO 3650–98, Geometrical Product Specifications (GPS). Length Standards. Gauge Blocks.
GOST 28798–90, Outer (spring-loaded head) Micrometers. General Technical Conditions.
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Translated from Izmeritel’naya Tekhnika, No. 6, pp. 19–21, June, 2011.
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Etingof, M.I. Technical measurements, interchangeability, and nanometrology. Meas Tech 54, 633–635 (2011). https://doi.org/10.1007/s11018-011-9777-x
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DOI: https://doi.org/10.1007/s11018-011-9777-x