Skip to main content
SpringerLink
Log in

Combined method of metrological self-tracking of measurement data processing programs

  • General Problems of Metrology and Measurement Technique
  • Published:
Measurement Techniques Aims and scope

Results from a study of a combined method for metrological self-tracking of software for processing direct measurement data are discussed. Two programs are considered as examples: one that carries out extremely simple calculations and another taken from the standard software for an actual measurement data system. These results can be used to evaluate the prospects for using the combined method in metrological practice.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Fig. 1
Fig. 2

Similar content being viewed by others

References

  1. K. K. Semenov and G. N. Solopchenko, “Theoretical prerequisites for implementation of metrological self-tracking of measurement data analysis programs,” Izmer. Tekhn., No. 6, 9–14 (2010); Measur. Techn., 53, No. 6, 596–599 (2010).

  2. D. Piponi, “Automatic differentiation, C++ templates, and photogrammetry,” J. Graphics Tools, 9, No. 4, 41–55 (2004).

    Google Scholar 

  3. C. Bischof and M. Bücker, “Computing derivatives of computer programs,” in: Modern Methods and Algorithms of Quantum Chemistry: Proc., 2nd. ed., Vol. 3, NIC Ser. (2000), pp. 315–327.

  4. Guide to the Expression of Uncertainty in Measurement [Russian translation], VNIIM im. D. I. Mendeleeva, St. Petersburg (1999).

  5. GOST 16153–80, Single-Crystal Germanium. Technical Conditions.

  6. V. Ya. Kreinovich and M. I. Pavlovich, “Error estimate for the result of indirect measurements by computer simulation,” Izmer. Tekhn., No. 3, 11–13 (2085); Measur. Techn., 28, No. 3, 201–205 (1985).

  7. Hung T. Nguen et al., “Why two sigma? A theoretical justification,” in: Soft Computing in Measurement and Information Acquisition, L. Reznik and V. Kreinovich (eds.), Springer-Verlag, Berlin, Heidelberg (2003), pp. 10–22.

    Google Scholar 

  8. Propagation of Distributions Using a Monte-Carlo Method, in: Evaluation of Measurement Data: Annex 1 to Guide to the Expression of Uncertainty in Measurement [Russian translation], Professional, St. Petersburg (2010).

  9. A. Griewank, “On automatic differentiation,” in: Mathematical Programming. Recent Developments and Applications, M. Iri and K. Tanabe (eds.), Kluwer Acad. Publ., Amsterdam (1989), pp. 83–108.

    Google Scholar 

  10. P. Wolfe, “Checking the calculation of gradients,” ACM TOMS, 6, No. 4, 337–343 (1982).

    Article  Google Scholar 

  11. B. D. Hall, “Calculating measurement uncertainty using automatic differentiation,” Meas. Sci. Technol., 13, No. 4, 421–427 (2002).

    ADS  Google Scholar 

  12. Luca Mari, “A computational system for uncertainty propagation of measurement results,” Measurement, 42, Iss. 6, 844–855 (2009).

    Article  MathSciNet  Google Scholar 

  13. MI 3286–2010, Recommendation. Verification of the Protection of Software and Determining Its Level During Tests of Means of Measurements for Type Confirmation.

Download references

Author information

Authors and Affiliations

  1. St. Petersburg State Polytechnic University, St. Petersburg, Russia

    K. K. Semenov & G. N. Solopchenko

Authors
  1. K. K. Semenov
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. G. N. Solopchenko
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to K. K. Semenov.

Additional information

Translated from Izmeritel’naya Tekhnika, No. 4, pp. 14–19, April, 2011.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Semenov, K.K., Solopchenko, G.N. Combined method of metrological self-tracking of measurement data processing programs. Meas Tech 54, 378–386 (2011). https://doi.org/10.1007/s11018-011-9736-6

Download citation

  • Received:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s11018-011-9736-6

Key words

Search

Navigation