Generalized metrological characteristics of intelligent measuring instruments are developed, tested for adequacy, and studied.
Similar content being viewed by others
References
G. Korn and T. Korn, Mathematical Handbook for Scientists and Engineers [Russian translation], Nauka, Moscow (1984).
V. P. Shevchuk, Computation of Dynamic Errors in Intelligent Measurement Systems [in Russian], Fizmatlit, Moscow (2008).
S. I. Danilov, Parametric Synthesis of Measurement Channels for Automatic Process Controllers: Author’s Abstract of Candidate’s Dissertation in Technical Sciences [in Russian], Volzhskii (2000).
Author information
Authors and Affiliations
Corresponding author
Additional information
Translated from Izmeritel’naya Tekhnika, No. 12, pp. 8–14, December, 2010.
Rights and permissions
About this article
Cite this article
Shevchuk, V.P. Models of the metrological characteristics of intelligent measurement instruments. Meas Tech 53, 1307–1315 (2011). https://doi.org/10.1007/s11018-011-9658-3
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11018-011-9658-3