Features of total external reflection x-ray fluorescence analysis and certain aspects in the miniaturization of spectrometers are briefly considered. The design of a miniature experimental cell for spectrometry of the surface layers of different materials and the dry residues of liquids, developed on the base of a planar xray waveguide-resonator, along with experimental data, are presented.
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References
Y. Yoneda and T. Horiuchi, “Optical flats for use in x-ray spectrochemical microanalysis,” Rev. Sci. Instrum., 42, 1069 (1971).
H. Aiginger and P. Wobrauschek, “A method for quantitative x-ray fluorescence analysis in the nanogram region,” Nucl. Inst. & Meth., 114, 157 (1974).
R. E. Grieken and A. A. Markwicz (eds.), Handbook of x-Ray Spectrometry. Methods and Techniques, Decker (1993), p. 453.
R. Klockenkamper, Total Reflecton x-Ray Fluorescence Analysis, Wiley, New York (1997).
S. Kunimura and J. Kawai, “Portable total reflection x-ray spectrometer for nanogram Cr detection limit,” Analyt.Chem., 79(b), 2593 (2007).
V. K. Egorov and E. V. Egorov, “Background of x-ray nanophotonics based on the planar air waveguide-resonator,” x-Ray Spectrometry, 36, 381 (2007).
V. K. Egorov and E. V. Egorov, “Experimental studies and model of the formation of x-ray beams in the nanodimensional range,” Poverkhnost, No. 12, 24 (2005).
V. K. Egorov, E. V. Egorov, and M. S. Afanasiev, “Comparative analysis of the effectiveness of the method of TER x-ray fluorescence analysis with the use of waveguide-resonance and slit formers of excitation fluxes,” Poverkhnost, No. 11, 34 (2008).
V. K. Egorov and E. V. Egorov, “Practical implementation of an increase in the aperture ratio of planar x-ray waveguide-resonators,” Poverkhnost, No. 1, 1 (2009).
V. K. Egorov and E. V. Egorov, “Total external reflection x-ray fluorescence analysis spectroscopy with formation of an exciting beam by means of an x-ray waveguide-resonator,” Poverkhnost, No. 7, 5 (2005).
E. P. Bertin, Principles and Practice of x-Ray Spectrometric Analysis, Plenum Press, New York (1975).
F. F. Komarov, M. A. Kumakhov, and I. S. Tashlykov, Nondestructive Analysis of the Surfaces of Solids by Means of Ion Beams [in Russian], Izd. Universitetskoe, Minsk (1967).
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Translated from Izmeritel’naya Tekhnika, No. 5, pp. 33–38, May, 2010.
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Egorov, V.K., Egorov, E.V. Miniature cell for total external reflection x-ray fluorescence analysis. Meas Tech 53, 510–517 (2010). https://doi.org/10.1007/s11018-010-9535-5
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DOI: https://doi.org/10.1007/s11018-010-9535-5