The degradation of semiconductor CMOS structures due to the action of overloads in the form of ultra-short video pulses is investigated. It is shown that these video pulses in Schmitt triggers produce a change in the threshold voltages and a contraction of the area of uncertainty. In buffer elements, intense phase noise occurs, while in RC generators there is a change in the length and repetition frequency of the pulses generated. Experimental equipment for determining the critical parameters of the actions of ultra-short video pulses on a sample of digital microcircuits and CMOS structures is described.
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Translated from Izmeritel’naya Tekhnika, No. 12, pp. 46–50, December, 2009.
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Bobreshov, A.M., Dyboi, A.V., Razuvaev, Y.Y. et al. An experimental investigation of the stability of CMOS-logic integrated Schmitt triggers to ultra-short pulse overloads. Meas Tech 52, 1351–1357 (2009). https://doi.org/10.1007/s11018-010-9444-7
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DOI: https://doi.org/10.1007/s11018-010-9444-7