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The systematic errors of the measurement of the parameters of low-frequency noise with a 1/f γ spectrum

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Measurement Techniques Aims and scope

Recommendations are made for choosing the optimum parameters of a procedure for measuring the spectral power density of noise G(f) for problems of the nondestructive quality control of electronic equipment as regards the parameters of low-frequency noise. Expressions are derived for the systematic error in determining the exponent in the frequency dependence G(f) from single measurements of the noise at two frequencies.

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Authors and Affiliations

  1. Ul’yanovsk Branch of the Kotel’nikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences, Ul’yanovsk, Russia

    V. A. Sergeev

  2. Ul’yanovsk State Technical University, Ul’yanovsk, Russia

    O. A. Dulov

Authors
  1. V. A. Sergeev
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  2. O. A. Dulov
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Corresponding author

Correspondence to V. A. Sergeev.

Additional information

Translated from Izmeritel’naya Tekhnika, No. 10, pp. 51–53, October, 2008.

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Sergeev, V.A., Dulov, O.A. The systematic errors of the measurement of the parameters of low-frequency noise with a 1/f γ spectrum. Meas Tech 51, 1122–1127 (2008). https://doi.org/10.1007/s11018-009-9172-z

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  • DOI: https://doi.org/10.1007/s11018-009-9172-z

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