Abstract
The use of a vector-analytic method of computational estimation of the error of a measuring device is demonstrated using an infrared Fourier spectrometer as an example. The results of such an estimate are compared with experiment and results obtained by two other methods.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
V. D. Mazin, Prib. Syst. Upravl., No. 10, 37 (1995).
P. V. Novitskii and I. A. Zograf, Estimating the Errors of Measurement Results [in Russian], Énergoatomizdat, Leningrad (1991).
Manual on Expressing Measurement Indeterminateness [Russian translation], Mendeleev All-Russia Research Institute of Metrology, St. Petersburg (1999).
E. S. Levshina and P. V. Novitskii, Electrical Measurements of Physical Quantities (Measuring Transducers) [in Russian], Énergoatomizdat, Leningrad (1983).
Author information
Authors and Affiliations
Corresponding author
Additional information
__________
Translated from Izmeritel’naya Tekhnika, No. 2, pp. 28–32, February, 2008.
Rights and permissions
About this article
Cite this article
Mazin, V.D., Chepushtanov, A.N. Application of a vector-analytic model for metrological analysis of an infrared Fourier spectrometer. Meas Tech 51, 152–157 (2008). https://doi.org/10.1007/s11018-008-9013-5
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11018-008-9013-5