Skip to main content
SpringerLink
Log in

Determination of the electrical resistance of a thin-film contact taking into account the spatial nonuniformity of the current distribution

  • Electromagnetic Measurements
  • Published:
Measurement Techniques Aims and scope

Abstract

Existing methods of determining the electrical resistance of a thin-film contact are analyzed. A physical model and an equivalent electric circuit of the contact and its parts are proposed, taking into account the nonuniform current distribution and the potential in the volume of thin-film layers.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. O. M. Kresin and A. L. Kharinskii, Vopr. Radioélektron., Det. Kompon. Apparat., No. 5, 15 (1964).

  2. Yu. P. Ermolaev and F. G. Karimova, Obmen Opyt. Radioélektron. Promyshl., No. 4, 15 (1965).

  3. O. M. Kresin, I. M. Roginskii, and A. L. Kharinskii, Élektron. Tekh. Mikroélektron., No. 5, 96 (1967).

  4. S. V. Kainov and E. A. Alekseeva, Élektron. Tekh. Radiokomp., No. 5, 120 (1967).

  5. A. L. Kharinskii, Radio Apparatus Components Constructional Principles [in Russian], Énergiya, Leningrad (1971).

    Google Scholar 

  6. W. M. Lohetal, IEEE Trans. Electron Devices ED-34, No. 3, 512 (1987).

    Google Scholar 

  7. K. I. Martyushov, Yu. V. Zaitsev, and A. I. Tikhonov, Methods of Designing Resistors [in Russian], Énergiya, Moscow (1971).

    Google Scholar 

  8. V. V. Zadde and A. K. Zaitseva, Prib. Tekh. Éksper., No. 4, 191 (1969).

  9. G. F. Zhukov and V. K. Smolin, Inventors Certificate No. 1538703, Izobret., No. 34 (1995).

  10. M. A. Stovlovoi, Petersburgskii Zh. Élektron., No. 1, 52 (2001).

  11. V. G. Spirin, Vestnik Verkhne-Volzhskogo Otd. Akad. Tekh. Nauk RF. Vysokie Tekh. Radioélektron., Informat. Svyazi, No. 1(9), 11 (2003).

  12. K. I. Martyushov, A. I. Tikonov, and Yu. V. Zaitsev, Precision Nonwire Resistors [in Russian], Énergiya, Moscow (1979).

    Google Scholar 

  13. D. P. Kolesnikov et al., Élektron. Tekh. Mikroélektron., No. 4, 59 (1968).

  14. V. I. Smirnov and F. Yu. Matta, Theory of the Construction of Contacts in Electronic Apparatus [in Russian], Sovetskoe Radio, Moscow (1974).

    Google Scholar 

  15. V. A. Bessonov and V. N. Vigdorovich, Proizvods. Tekh. Opyt, No. 3, 62 (1985).

  16. N. N. Sorokoumov, V. S. Stepanskii, and A. D. Naikevich, Élektron. Tekh. Upravl. Kachestvom Standartizats., No. 11(29), 82 (1974).

  17. A. N. Lugin and M. M. Ozemsha, Izv. Vyssh. Ucheb. Zaved. Élektron., No. 1, 44 (2002).

  18. V. P. Sigorskii, Analysis of Electronic Circuits [in Russian], Gos. Izd. Tekh. Lit. UkSSR, Kiev (1964).

    Google Scholar 

  19. A. A. Amosov, Yu. A. Dubinskii, and N. V. Kopchenova, Computational Methods for Engineers [in Russian], Vysshaya Shkola, Moscow (1994).

    Google Scholar 

  20. V. G. Nedorezov, Cermet Thick-Film Resistor Materials, Inform.-Izd. Tsentr Penz. Gos. Univ., Penza (2002).

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Research Institute of Electronic-Mechanical Instruments, Russia

    A. N. Lugin

Authors
  1. A. N. Lugin
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

__________

Translated from Izmeritel’naya Tekhnika, No. 5, pp. 55–58, May, 2007.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Lugin, A.N. Determination of the electrical resistance of a thin-film contact taking into account the spatial nonuniformity of the current distribution. Meas Tech 50, 538–542 (2007). https://doi.org/10.1007/s11018-007-0106-3

Download citation

  • Received:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s11018-007-0106-3

Key words

Search

Navigation