Abstract
New methods of spectrometry of attenuated total internal reflection are considered. By means of these methods, it is possible to obtain reflection spectra and the indices of refraction and absorption of highly refracting and strongly absorbing media.
Similar content being viewed by others
References
R. K. Mamedov and I. V. Kheynonen, Optich. Zh., 65, No. 10, 78 (1998).
Patent 214123 (Great Britain).
R. K. Mamedov, Optich. Zh., 67, No. 9, 73 (2000).
R. K. Mamedov, G. M. Mansurov, and N. I. Dubovikov, Optiko-Mekhanich. Prom., No. 4, 56 (1982).
R. K. Mamedov et al., Opt. Spektroskop., 89, No. 3, 450 (2000).
G. V. Saydov et al., Izmer., Kontr., Avtomatizats., No. 4(48), 13 (1983).
R. K. Mamedov et al., Optich. Zh., 65, No. 10, 76 (1998).
M. A. Karabegov, Izmer. Tekh., No. 11, 50 (2004); Measure. Tech., 47, No. 11, 1106 (2004).
Author information
Authors and Affiliations
Additional information
__________
Translated from Izmeritel’naya Tekhnika, No. 4, pp. 27–30, April, 2007.
Rights and permissions
About this article
Cite this article
Mamedov, R.K., Karabegov, M.A. New spectrometric methods based on attenuated total internal reflection. Meas Tech 50, 384–389 (2007). https://doi.org/10.1007/s11018-007-0079-2
Received:
Issue Date:
DOI: https://doi.org/10.1007/s11018-007-0079-2