Abstract
A Bayesian model is proposed based on randomizing the systematic errors of the instruments. Conditions are identified under which the randomization reduces the expected bias in estimating a measured quantity.
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Translated from Izmeritel’naya Tekhnika, No. 3, pp. 22–25, March, 2007.
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Khovanov, N.V. A Bayesian model for measurements on a set of instruments. Meas Tech 50, 255–258 (2007). https://doi.org/10.1007/s11018-007-0057-8
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DOI: https://doi.org/10.1007/s11018-007-0057-8