Abstract
Methods of measuring the fundamental parameters of the low-frequency noise of semiconductor devices are considered and versions of instruments for monitoring the noise characteristics of microcircuits, discrete transistors and other semiconductor devices are suggested.
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Translated from Izmeritel’naya Tekhnika, No. 12, pp. 46–49, December, 2006.
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Gorlov, M.I., Smirnov, D.Y. & Anufriev, D.L. Measurement of the noise parameters of semiconductor devices. Meas Tech 49, 1241–1245 (2006). https://doi.org/10.1007/s11018-006-0267-5
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DOI: https://doi.org/10.1007/s11018-006-0267-5