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Russian version printed with certain editorial changes.
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Translated from Izmeritel'naya Tekhnika, No. 7, pp. 3–4, July, 2005.
An erratum to this article is available at http://dx.doi.org/10.1007/s11018-006-0199-0.
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Vollard, A. Global Confidence from Identifiability in the SI System. Meas Tech 48, 629–631 (2005). https://doi.org/10.1007/s11018-005-0194-x
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DOI: https://doi.org/10.1007/s11018-005-0194-x