Skip to main content
Log in

On Random Marked Sets with a Smaller Integer Dimension

  • Published:
Methodology and Computing in Applied Probability Aims and scope Submit manuscript

Abstract

The paper deals with random marked sets in \({\mathbb R}^d\) which have integer dimension smaller than d. Statistical analysis is developed which involves the random-field model test and estimation of first and second-order characteristics. Special models are presented based on tessellations and solutions of stochastic differential equations (SDE). The simulation of these sets makes use of marking by means of Gaussian random fields. A space-time nature of the model based on SDE is taken into account. Numerical results of the estimation and testing are discussed. Real data analysis from the materials research investigating a grain microstructure with disorientations of faces as marks is presented.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  • Baddeley A, Møller J, Waagepetersen R (2000) Non- and semiparametric estimation of interaction in inhomogeneous point patterns. Stat Neerl 54:329–350

    Article  MATH  Google Scholar 

  • Ballani F, Kabluchko Z, Schlather M (2012) Random marked sets. Adv Appl Probab 44(3):603–616

    Article  MATH  MathSciNet  Google Scholar 

  • Beneš V, Rataj J (2004) Stochastic geometry—selected topics. Kluwer, Dordrecht

    MATH  Google Scholar 

  • Fréchet M (1951) Sur les tableaux de corrélation dont les marges sont données. Annals de l’Université de Lyon 9, sec. A:53–77

  • Grabarnik P, Myllymaki M, Stoyan D (2011) Correct testing of mark independence for mark point patterns. Ecol Model 222:3888–3894

    Article  Google Scholar 

  • Hellmund G, Prokešová M, Vedel-Jensen E (2008) Lévy-based Cox point processes. Adv Appl Probab SGSA 40(3):603–629

    Article  MATH  Google Scholar 

  • Illian J, Penttinen A, Stoyan H, Stoyan D (2008) Statistical analysis and modelling of spatial point patterns. Wiley, New York

    MATH  Google Scholar 

  • Ilucová L, Saxl I, Svoboda M, Sklenička V, Král P (2007) Structure of ECAP Aluminium after different number of passes. Image Anal Stereol 26:37–43

    Article  Google Scholar 

  • Molchanov I (1984) Labelled random sets. Theory Probab Math Stat 29:113–119

    MATH  MathSciNet  Google Scholar 

  • Pawlas Z (2009) Empirical distributions in marked point processes. Stoch Process Appl 119:4194–4209

    Article  MATH  MathSciNet  Google Scholar 

  • Randle V, Engler O (2000) Introduction to texture analysis—macrotexture, microtexture and orientation mapping. CRC Press, Boca Raton

    Google Scholar 

  • Saxl I, Sklenička V, Ilucová L, Svoboda M, Dvořák J, Král P (2009) The link between microstructure and creep in aluminium procesed by equal-channel angular dressing. Mater Sci Eng A 503:82

    Article  Google Scholar 

  • Schlather M, Ribeiro PJ, Diggle PJ (2004) On the second-order characteristics of marked point processes. Detecting dependence between marks and locations of marked point processes. J. R. Stat. Soc. B 66:79–93

    Article  MATH  MathSciNet  Google Scholar 

  • Stoyan D, Kendall WS, Mecke J (1995) Stochastic geometry and its applications. Wiley & Sons, Chichester

    MATH  Google Scholar 

  • Šedivý O, Staněk J, Kratochvílová B, Beneš V (2013) Sliced inverse regression for dimension reduction in random marked sets with covariates. Adv Appl Probab 45(3)

  • Zähle M (1982) Random processes of Hausdorff rectifiabble closed SETS. Math Nachr 108:49–72

    Article  MathSciNet  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Jakub Staněk.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Staněk, J., Šedivý, O. & Beneš, V. On Random Marked Sets with a Smaller Integer Dimension. Methodol Comput Appl Probab 16, 397–410 (2014). https://doi.org/10.1007/s11009-013-9335-x

Download citation

  • Received:

  • Revised:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s11009-013-9335-x

Keywords

AMS 2000 Subject Classification

Navigation