Abstract
Photonic crystals (PCs) are synthetic materials that are used to control light propagation. PCs have a frequency bandgap where light is forbidden to propagate. This bandgap is strongly tied to the microstructure of the photonic crystal. Three-dimensional tungsten photonic crystal in a Lincoln-log microstructure has been suggested as a strong alternative filter in photovoltaic cells with significantly high power efficiency. PCs have also been suggested as sensors for submicron damage. Therefore, mechanical characterization of three-dimensional photonic crystals becomes of interest. Here we report on mechanical characterization of tungsten PC using means of micro-indentation. We also present a three-dimensional finite element simulation of the structural response of a Tungsten photonic crystal under micro-indentation load. Stresses developed in the PC can be used to quantify the level of damage in the crystal. We compare our simulation results with the experimental observations of a Vickers and Knoop micro-indentation experiments of tungsten PC. The FE models were proven able to simulate the mechanical response of the PC with a good accuracy. The calibrated FE models can be further used to realize the mechanical behavior of PC under different thermal and mechanical stresses when used as filters in photovoltaic cells or to simulate the effect of damage in PC sensors.
This is a preview of subscription content, access via your institution.












References
ANSYS: Ansys Reference Manual. Version 10.0. Available via http://www.ansys.com/ (2007)
Bažant, Z.P.: Scaling laws in mechanics of failure. J. Eng. Mech. 119, 1828–1844 (1993). doi:10.1061/(ASCE)0733-9399(1993)119:9(1828)
Biswas, R., El-Kady, I., Lin, S.Y., Ho, K.M.: Enhanced complete photonic band gap in the optimized planar diamond structure. Photonics. Nanostruct. Fundam. Appl. 1, 15 (2003)
Briant, C.L.: Tungsten: properties, processing, and applications. Adv. Mater. Process. 154, 29 (1998)
Doerner, M.F., Gardner, D.S., Nix, W.D.: Plastic properties of think films on substrates as measured by submicron indentation hardness and substrate curvature techniques. J. Mater. Res. 1(6), 845–851 (1987). doi:10.1557/JMR.1986.0845
El-Kady, I., Sigalas, M.M., Biswas, R., Ho, K.M., Soukoulis, C.M.: Metallic photonic crystals at optical wavelengths. Phys. Rev. B 62, 15299–15302 (2000). doi:10.1103/PhysRevB.62.15299
El-Kady, I., Reda Taha, M.M., Su, M.: Application of photonic crystals in submicron damage detection and quantification. Appl. Phys. Lett. 88, 253109 (2006). doi:10.1063/1.2212050
Elmustafa, A.A., Ananda, A.A., Elmahboub, W.M.: Bilinear behavior in nano and microindentation tests of fcc polycrystalline materials. J. Eng. Mater. Technol. 126, 353–359 (2004). doi:10.1115/1.1789962
Gong, W., Wu, J., Guan, Z.: Load dependence of the apparent hardness of silicon nitride in a wide range of loads. Mater. Lett. 35, 58–61 (1998). doi:10.1016/S0167-577X(97)00234-6
Gorham, D.A., Pope, P.H., Field, J.E.: An improved method for compressive stress-strain measurements at very high strain rates. Proc. R. Soc. Lond. A Math. Phys. Sci. 438, 153–170 (1992)
Kunjomana, A.G., Chandrasekharan, K.A.: Microhardness studies of GaTe whiskers. Cryst. Res. Technol. 40, 782–785 (2005). doi:10.1002/crat.200410431
Lee, J.W., Kim, J.K., Kim, S.H., Sun, H.J., Yang, H.S., Sohn, H.C., et al.: Physical and electrical characteristics of physical vapor-deposited tungsten for bit line process. Jpn. J. Appl. Phys. 43(12), 8007–8012 (2004). doi:10.1143/JJAP.43.8007
Lin, S.Y., Flemming, J.G., Hetherington, D.L., Smith, B.K., Biswas, R., Ho, K.M., et al.: A three-dimensional photonic crystal operating at infrared wavelengths. Nature 394, 251 (1998). doi:10.1038/28343
Misra, A., Kung, H.: Deformation behavior of nanostructured metallic multilayers. Adv. Eng. Mater. 3, 217 (2001). doi:10.1002/1527-2648(200104)3:4<217::AID-ADEM217>3.0.CO;2-5
Paturaud, C., Farges, G., Sainte Catherine, M.C., Machet, J.: Correlation between hardness and embedded argon content of magnetron sputtered chromium films. Thin Solid Films 347, 46–55 (1999). doi:10.1016/S0040-6090(98)01417-5
Pauleau, Y., Dassapa, F.C., Lami, P., Oberlin, J.C., Romagna, F.: Silicide formation in metali/Si structures and diffusion barrier properties of CVD tungsten films. J. Mater. Res. 4(1), 156–162 (1989). doi:10.1557/JMR.1989.0156
Roy, R.A., Petkie, R., Boulding, A.: Properties and microstructure of tungsten films deposited by iron-assisted evaporation. J. Mater. Res. 6(1), 80–91 (1991). doi:10.1557/JMR.1991.0080
Schackelford, J.F.: Introduction to Materials Science for Engineers, 6th edn. New York (2005)
Sheyka, M.: Numerical and Experimental Investigation of Photonic Crystals as Sensors for Submicron Damage. M.Sc. Thesis, University of New Mexico, May (2008)
Stubičar, M., Tonejc, A., Radić, N.: Microhardness characterization of Al-W thin films. Vacuum 61, 309–316 (2001)
Verley, J.C., Mani, S.S., Fleming, J.G., El-Kady, I., Khraishi, T., Reda Taha, M.M.: Experimental demonstration of using nanophotonic crystal sensor systems for submicron damage detection, quantification, and diagnoses. Proc. SPIE 6179, 617904 (2006). doi:10.1117/12.658676
Yih, S.W.H., Wang, C.T.: Tungsten: Sources, Metallurgy, Properties, and Applications. Plenum Press, New York (1979)
Yo-Han, Y., Woong, L., Hyunho, S.: Spherical nano-indentation of a hard thin film/soft substrate layered system: critical indentation depth. Model. Simul. Mater. Sci. Eng. 12, 59–67 (2004). doi:10.1088/0965-0393/12/1/006
Young, J.F., Mindess, S., Gray, R.J., Bentur, A.: The Science and Technology of Civil Engineering Materials. Prentice-Hall Inc., New Jersey (1998)
Zong, Z., Lou, J., Adewoye, O.O., Elmustafa, A.A., Hammad, F., Soboyejo, W.O.: Indentation size effects in the nano- and micro-hardness of fcc single crystal metals. Mater. Sci. Eng. A 434, 178–187 (2006)
Acknowledgements
This research was partly funded by Sandia National Laboratories (SNL). Sandia is a multiprogram laboratory operated by Sandia Corporation, a Lockheed Martin Company, for the United States Department of Energy’s National Nuclear Security Administration under contract DE-AC04-94AL85000. Specimens tested here were provided by the late Dr. J. Fleming, Sandia National Laboratories. The authors owe special thanks for Dr. Fleming for his sincere support throughout the study. Special thanks should also go to the Defense Threat Reduction Agency (DTRA)-Student Research Assistant (SRA) program for funding the first author during the course of this study. The authors greatly acknowledge this support. Finally, assistance with the simulations by Julie Kimsal from the mechanical engineering department at UNM is appreciated.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Sheyka, M., El-Kady, I., Khraishi, T. et al. Micro-indentation of metallic photonic crystals: experimental and numerical investigations. Int J Mech Mater Des 4, 407–418 (2008). https://doi.org/10.1007/s10999-008-9079-x
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10999-008-9079-x
Keywords
- Photonic crystals
- Bandgap
- Micro-indentation
- Finite element method
- Micro damage
- Vickers
- Knoop