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Thermoanalytical and structural properties of metal oxide semiconductor and palladium/layer silicate nanocomposites

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Summary

The thermoanalytical and structural properties of composites of layer silicates with metal oxide semiconductors (TiO<Subscript>2</Subscript>, ZnO and SnO<Subscript>2</Subscript>) prepared by adsorption and heterocoagulation (sol/gel technology) were studied. In addition to metal oxides, the intercalation of nanoparticles of noble metal, palladium was also investigated using the above experimental technique. It was established that the incorporation of nanoparticles into the layered structure is adequately described by thermoanalytical data. When metallic palladium nanoparticles are stabilized by surfactants and macromolecules, heat decomposition of the stabilizers within the nanocomposite can also be detected. Thermoanalytical data were combined with X-ray diffraction and transmission electron microscopic information to verify the composition of the composites. Changes in the nanoparticle content of the composites were also confirmed by structural studies.

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D&#233;k&#225;ny, I. Thermoanalytical and structural properties of metal oxide semiconductor and palladium/layer silicate nanocomposites. J Therm Anal Calorim 79, 595–604 (2005). https://doi.org/10.1007/s10973-005-0584-y

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  • DOI: https://doi.org/10.1007/s10973-005-0584-y

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