Heavily Yb-doped silicate glass thick films
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A series of Yb-doped glass films has been prepared by sol–gel processing within the SiO2–Al2O3–P2O5–Yb2O3 system with doping levels up to 30 mol% Yb on a cation basis, with a thickness up to ~36 μm. The refractive indices at 633 nm, measured by spectroscopic ellipsometry, varied between 1.457 and 1.577, depending on the composition. Infrared (IR) and Raman spectroscopies were used to establish the main structural features of the different compositions, which included the presence of mixed Si–O–Al bonds evidenced by a IR peak at 940 cm−1, as well as P=O bonds revealed by a Raman peak at 1326 cm−1. The photoluminescence spectrum of Yb3+ ions was dominated by peaks at 987 and 1020 nm, with a lifetime between ~0.5–1.0 ms.
KeywordsSol–gel Aluminosilicate films Phosphosilicate films Yb doping
The present work was funded by ANI (COMPETE program, FEDER, Portugal) through the Multilaser Project (No. 30179).
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