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Photo-quenched luminescence in Co(II)-doped sol–gel zirconia

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Abstract

The quenching process of the laser-induced luminescence of Co(II)-doped zirconia samples prepared by the sol–gel method is reported. Zirconia monoliths doped with Co(II) at different concentrations, were laser irradiated producing fluorescence; its intensity, measured by the slope at the low energy side of the Raman spectra, is reduced with the irradiation time. The rate the fluorescence decays can be modeled as a double exponential function of the irradiation time; the characteristic times involved in this quenching process are in the range of seconds. The suppression of the luminescence has been associated to the local heating produced when the laser beam is focused in a small area (≈2 microns in diameter) on the sample. This heating process reduces physical (such as grain boundaries and surface states) and chemical (oxygen vacancies) defects; however, some residual fluorescence still remains after long periods of illumination.

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Acknowledgments

The authors acknowledge the valuable help of F. Rodríguez-Melgarejo for technical assistance in the PL/Raman spectroscopy experiments and of Martín A. Hernández-Landaverde for the X-ray analysis.

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Authors and Affiliations

  1. Centro de Investigación y Estudios Avanzados, IPN, Unidad Querétaro, A. Postal 1-798, Queretaro, Queretaro, 76001, Mexico

    R. Rodríguez & S. Jiménez-Sandoval

  2. Centro de Física Aplicada y Tecnología Avanzada, UNAM, Apdo. Postal 1-1010, Queretaro, Queretaro, 76000, Mexico

    R. Rodríguez, M. Estevez & S. Vargas

  3. Instituto Mexicano del Petróleo, Av. 100 metros, Mexico, DF, Mexico

    S. Pacheco

Authors
  1. R. Rodríguez
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  2. S. Jiménez-Sandoval
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  3. M. Estevez
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  4. S. Pacheco
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  5. S. Vargas
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Corresponding author

Correspondence to R. Rodríguez.

Additional information

R. Rodríguez is on sabbatical leave at Cinvestav, Unidad Queretaro.

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Rodríguez, R., Jiménez-Sandoval, S., Estevez, M. et al. Photo-quenched luminescence in Co(II)-doped sol–gel zirconia. J Sol-Gel Sci Technol 44, 97–104 (2007). https://doi.org/10.1007/s10971-007-1608-9

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  • DOI: https://doi.org/10.1007/s10971-007-1608-9

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