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Depth profiling Cr in surface layers by 52Cr(p,γ)53Mn nuclear resonance reaction analysis

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Abstract

A method for depth profiling chromium in the surface and near surface regions of materials using the resonance at 1,005 keV in 52Cr(p,γ)53Mn nuclear reaction is presented. The detection sensitivity, depth resolution and probing depth of the resonance in Si are determined to be about 3 at.%, 25 nm and 2.5 µm respectively from the excitation function of the reaction constructed in 0.90–1.2 MeV proton energy region by measuring 378 keV prompt γ-rays from 53Mn nuclei. The reaction is interference free. These features make the approach attractive for profiling chromium in mid as well as high Z matrices.

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Authors and Affiliations

  1. National Centre for Compositional Characterization of Materials, BARC, ECIL Post, Hyderabad, 500062, India

    Pritty Rao, S. Vikram Kumar & Sanjiv Kumar

Authors
  1. Pritty Rao
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  2. S. Vikram Kumar
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  3. Sanjiv Kumar
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Correspondence to Sanjiv Kumar.

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Rao, P., Vikram Kumar, S. & Kumar, S. Depth profiling Cr in surface layers by 52Cr(p,γ)53Mn nuclear resonance reaction analysis. J Radioanal Nucl Chem 302, 1399–1403 (2014). https://doi.org/10.1007/s10967-014-3646-4

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  • DOI: https://doi.org/10.1007/s10967-014-3646-4

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