Abstract
A combination of secondary ion mass spectrometry, optical profilometry and a statistically-driven algorithm was used to develop a non-contact volume analysis method to validate the useful yields of nuclear materials. The volume analysis methodology was applied to ion sputter craters created in silicon and uranium substrates sputtered by 18.5 keV O− and 6.0 keV Ar+ ions. Sputter yield measurements were determined from the volume calculations and were shown to be comparable to Monte Carlo calculations and previously reported experimental observations. Additionally, the volume calculations were used to determine the useful yields of Si+, SiO+ and SiO2 + ions from the silicon substrate and U+, UO+ and UO2 + ions from the uranium substrate under 18.5 keV O− and 6.0 keV Ar+ ion bombardment. This work represents the first steps toward validating the interlaboratory and cross-platform performance of mass spectrometry for the analysis of nuclear materials.
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References
Esaka F, Magara M, Lee CG, Sakurai S, Usuda S, Shinohara N (2009) Talanta 78:290
Gunther-Leopold I, Waldis JK, Wernli B, Kopajtic Z (2005) Int J Mass Spectrom 242:197
Kraiem M, Richter S, Kuhn H, Stefaniak EA, Kerckhove G, Truyens J, Aregbe Y (2011) Anal Chem 83:3011
Pitois A, de las Heras LA, Betti M (2008) Int J Mass Spectrom 270:118
Pointurier F, Pottin AC, Hubert A (2011) Anal Chem 83:7841
Zhang XZ, Esaka F, Esaka KT, Magara M, Sakurai S, Usuda S, Watanabe K (2007) Spectrochim Acta B 62:1130
Child DP, Hotchkis MAC, Whittle K, Zorko B (2010) Nucl Instrum Methods B 268:820
Gotcu-Freis P, Colle JY, Hiernaut JP, Benes O, Gueneau C, Konings RJM (2014) J Chem Thermodyn 71:212
Johnson SG, Fearey BL (1993) Spectrochim Acta B 48:1065
Liezers M, Pratt SH, Hart GL, Duckworth DC (2013) J Radioanal Nucl Chem 296:1037
Riciputi LR, Ingeneri KB, Hedberg PMI (2002) Proc IAEA 347–353:392
Gillen G, Szakal C, Brewer TM (2011) Surf Interface Anal 43:376
King BV, Pellin MJ, Moore JF, Veryovkin IV, Savina MR, Tripa CE (2003) Appl Surf Sci 203:244
Tamborini G, Donohue DL, Rudenauer FG, Betti M (2004) J Anal Atom Spectrom 19:203
Xu JY, Szakal CW, Martin SE, Peterson BR, Wucher A, Winograd N (2004) J Am Chem Soc 126:3902
Wittmaack K (1996) Surf Interface Anal 24:389
Heinrich R, Wucher A (2003) Nucl Instrum Methods B 207:136
Nagatomi T, Bungo T, Takai Y (2009) Surf Interface Anal 41:581
Baryshev SV, Zinovev AV, Tripa CE, Erck RA, Veryovkin IV (2012) Appl Surf Sci 258:6963
Winograd N (2013) Surf Interface Anal 45:3
Houssiau L, Mine N (2010) Surf Interface Anal 42:1402
Mahieu S, Depla D (2007) Appl Phys Lett 90:121117
Vandervorst W, Janssens T, Huyghebaert C, Berghmans B (2008) Appl Surf Sci 255:1206
Kuruc J, Harvan D, Galanda D, Matel L, Jerigova M, Velic D (2011) J Radioanal Nucl Chem 289:611
Kuruc J, Strisovska J, Galanda D, Dulanska S, Matel L, Jerigova M, Velic D (2012) J Radioanal Nucl Chem 292:973
Bersani M, Giubertoni D, Iacob E, Barozzi M, Pederzoli S, Vanzetti L, Anderle M (2006) Appl Surf Sci 252:7315
Priggemeyer S, Heiland W (1993) Nucl Instrum Methods B 78:198
Zalar A, Kovac J, Pracek B, Panjan P, Ceh M (2008) Appl Surf Sci 254:6611
Meuris M, Debisschop P, Leclair JF, Vandervorst W (1989) Surf Interface Anal 14:739
Migeon HN, Schuhmacher M, Legoux JJ, Rasser B (1989) Fresenius Z Anal Chem 333:333
Smith NS, Tesch PP, Martin NP, Boswell RW (2009) Microsc Microanal 15:312
Houssiau L, Mine N (2011) Surf Interface Anal 43:146
Muramoto S, Brison J, Castner DG (2012) Anal Chem 84:365
Yang L, Seah MP, Gilmore IS (2012) J Phys Chem C 116:23735
Wang KM, Shi BR, Cue N, Shen DY, Chen F, Wang XL, Lu F (2004) Nucl Instrum Methods B 225:503
Mayerhofer K, Foisner H, Piplits K, Hobler G, Palmetshofer L, Hutter H (2005) Appl Surf Sci 252:271
Jin K, Zhang Y, Xue H, Zhu Z, Weber WJ (2013) Nucl Instrum Methods B 307:65
Jin K, Zhang Y, Zhu Z, Grove DA, Xue H, Xue J, Weber WJ (2014) J Appl Phys 115:044903
Cheng J, Wucher A, Winograd N (2006) J Phys Chem B 110:8329
Mao D, Wucher A, Brenes DA, Lu CY, Winograd N (2012) Anal Chem 84:3981
Shard AG, Havelund R, Seah MP, Spencer SJ, Gilmore IS, Winograd N, Mao D, Miyayama T, Niehuis E, Rading D, Moellers R (2012) Anal Chem 84:7865
Sobers RC, Franzreb K, Williams P (2004) Appl Surf Sci 231:729
Franzreb K, Lorincik J, Williams P (2004) Surf Sci 573:291
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The research described in this paper was conducted under the Laboratory Directed Research and Development Program at Pacific Northwest National Laboratory, a multiprogram national laboratory operated by Battelle for the U.S. Department of Energy.
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Willingham, D., Naes, B.E. & Fahey, A.J. Validating mass spectrometry measurements of nuclear materials via a non-contact volume analysis method of ion sputter craters. J Radioanal Nucl Chem 303, 655–662 (2015). https://doi.org/10.1007/s10967-014-3313-9
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DOI: https://doi.org/10.1007/s10967-014-3313-9