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Characterization of nuclear materials by total reflection X-ray fluorescence spectrometry

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Abstract

Nuclear energy is one of the available energy options for long term energy security of world. In order to produce electricity using this mode of energy generation in an efficient and safe manner, it is necessary that the materials used for such energy generation comply with the specifications assigned. The major and trace composition of these materials is an important specification for their quality control. Different analytical techniques are used for such quality control. Total reflection X-ray fluorescence (TXRF) is a comparatively new technique having several features well suited for trace and major element determinations in nuclear materials. However, this technique has not been used so far extensively for characterization of nuclear materials. The present paper gives a brief introduction of TXRF, its suitability for nuclear material characterization and some details of the TXRF studies made in our laboratory for the characterization of nuclear materials.

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Acknowledgments

I express my sincere thanks to Dr. S. K. Aggarwal, Associate Director (R), Radiochemistry and Isotope Group, Dr. K. L. Ramakumar, Director Radiochemistry and Isotope Group and Dr. S. Kannan, Head Structural Studies section for their keen interest in the work. In addition, I am thankful to all co-authors of our different TXRF publications specially Dr. (Mrs.) Sangita Dhara Lenka, Dr. K. D. Singh Mudher and Dr. V. Venugopal. I gratefully acknowledge the helpful discussions with Prof. Jun Kawai (Kyoto University, Japan), Prof. Peter Wobrauschek, Prof. Christina Streli (Atominstitut, Vienna, Austria) and Prof. Imre Varga (Loránd Eötvös University, Budapest) from time to time.

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  1. Fuel Chemistry Division, Bhabha Atomic Research Centre, Trombay, Mumbai, 400085, India

    N. L. Misra

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Misra, N.L. Characterization of nuclear materials by total reflection X-ray fluorescence spectrometry. J Radioanal Nucl Chem 300, 137–145 (2014). https://doi.org/10.1007/s10967-014-2972-x

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  • DOI: https://doi.org/10.1007/s10967-014-2972-x

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