Josephson Coupling in Junctions Made of Monolayer Graphene Grown on SiC

  • B. Jouault
  • S. Charpentier
  • D. Massarotti
  • A. Michon
  • M. Paillet
  • J. R. Huntzinger
  • A. Tiberj
  • A.-A. Zahab
  • T. Bauch
  • P. Lucignano
  • A. Tagliacozzo
  • F. Lombardi
  • F. Tafuri
Original Paper

Abstract

Chemical vapor deposition has proved to be successful in producing graphene samples on silicon carbide (SiC) homogeneous at the centimeter scale in terms of Hall conductance quantization. Here, we report on the realization of co-planar diffusive Al/ monolayer graphene/ Al junctions on the same graphene sheet, with separations between the electrodes down to 200 nm. Robust Josephson coupling has been measured for separations not larger than 300 nm. Transport properties are reproducible on different junctions and indicate that graphene on SiC substrates is a concrete candidate to provide scalability of hybrid Josephson graphene/superconductor devices.

Keywords

Graphene Josephson effect Silicon carbide 

Notes

Acknowledgments

Discussions with Piet Brouwer and Victor Rouco Gomez are gratefully acknowledged. Work supported by PICS CNRS-CNR 2014-2016 “Transport phenomena and Proximity-induced Superconductivity in Graphene junctions”, Swedish Foundation for Strategic Research (SSF) under the project “Graphene based high frequency electronics”, FIRB “HybridNanoDev RBFR1236VV” (Italy). The research leading to these results have received partial funding from the European Union Seventh Framework Programme under grant agreement n604391 Graphene Flagship.

References

  1. 1.
    Heersche, H.B., Jarillo-Herrero, P., Oostinga, J.B., Vandersypen, L.M.K., Morpurgo, A.F.: Solid State Commun. 143, 72 (2007)ADSCrossRefGoogle Scholar
  2. 2.
    Heersche, H.B., Jarillo-Herrero, P., Oostinga, J.B., Vandersypen, L.M.K., Morpurgo, A.F.: Bipolar supercurrent in graphene. Nature 446, 56 (2007)ADSCrossRefGoogle Scholar
  3. 3.
    Xu, D., Skachko, I., Andrei, E.Y.: Phys. Rev. B 77, 184507 (2008)ADSCrossRefGoogle Scholar
  4. 4.
    Ojeda-Aristizabal, C., Ferrier, M., Guéron, S., Bouchiat, H.: Phys. Rev. B 79, 165436 (2009)ADSCrossRefGoogle Scholar
  5. 5.
    Borzenets, I.V., Coskun, U.C., Jones, S.J., Finkelstein, G.: Phys. Rev. Lett. 107, 137005 (2011)ADSCrossRefGoogle Scholar
  6. 6.
    Lee, G.-H., Jeong, D., Choi, J.-H., Doh, Y.-J., Lee, H.-J.: Phys. Rev. Lett. 107, 146605 (2011)ADSCrossRefGoogle Scholar
  7. 7.
    Popinciuc, M., Calado, V.E., Liu, X.L., Akhmerov, A.R., Klapwijk, T.M., Vandersypen, L.M.K.: Phys. Rev. B 85, 205404 (2012)ADSCrossRefGoogle Scholar
  8. 8.
    Coskun, U.C., Brenner, M., Hymel, T., Vakaryuk, V., Levchenko, A., Bezryadin, A.: Phys. Rev. Lett. 108, 097003 (2012)ADSCrossRefGoogle Scholar
  9. 9.
    Li, X.S., Cai, W.W., An, J.H., Kim, S., Nah, J., Yang, D.X., Piner, R., Velamakanni, A., Jung, I., Tutuc, E., Banerjee, S.K., Colombo, L., Ruoff, R.S.: Science 324, 1312 (2009)ADSCrossRefGoogle Scholar
  10. 10.
    Kedzierski, J., Hsu, P.-L., Healey, P., Wyatt, P.W., Keast, C.L., Sprinkle, M., Berger, C., Heer, W.A.: IEEE Trans. Electron Devices 55, 2078 (2008)ADSCrossRefGoogle Scholar
  11. 11.
    Chan, J., Venugopal, A., Pirkle, A., McDonnell, S., Hinojos, D., Magnuson, C.W., Ruoff, R.S., Colombo, L., Wallace, R.M., Vogel, E.M.: ACS Nano 6, 3224 (2012). PMID, 22390298CrossRefGoogle Scholar
  12. 12.
    Tanabe, S., Sekine, Y., Kageshima, H., Nagase, M., Hiroki, H.: Phys. Rev. B 84, 115458 (2011)ADSCrossRefGoogle Scholar
  13. 13.
    Lafont, F., Ribeiro-Palau, R., Kazazis, D., Michon, A., Couturaud, O., Consejo, C., Chassagne, T., Zielinski, M., Portail, M., Jouault, B., Schopfer, F., Poirier, W.: Nat. Commun. 6, 6806 (2015)ADSCrossRefGoogle Scholar
  14. 14.
    Ribeiro Palau, R., Lafont, F., Brun Picard, J., Kazazis, D., Michon, A., Cheynis, F., Couturaud, O., Consejo, C., Jouault, B., Poirier, W., Schopfer, F.: Nature Nano 10, 965 (2015)ADSCrossRefGoogle Scholar
  15. 15.
    Poirier, W., Lafont, F., Djordjevic, S., Schopfer, F., Devoille, L.: J. Appl. Phys. 115, 044509 (2014)ADSCrossRefGoogle Scholar
  16. 16.
    Komatsu, K., Li, C., Autier-Laurent, S., Bouchiat, H., Guéron, S.: Phys. Rev. B 86, 115412 (2012)ADSCrossRefGoogle Scholar
  17. 17.
    Li, K., Feng, X., Zhang, W., Yunbo, O., Chen, L., Ke, H., Wang, L.-L., Guo, L., Liu, G., Xue, Q.-K., Xucun, M.: Appl. Phys. Lett. 103, 062601 (2013)ADSCrossRefGoogle Scholar
  18. 18.
    Ludbrook, B.M., Levy, G., Nigge, P., Zonno, M., Schneider, M., Dvorak, D.J., Veenstra, C.N., Zhdanovich, S., Wong, D., Dosanjh, P., Strae~r, C., Sthr, A., Forti, S., Ast, C.R., Starke, U., Damascelli, A.: Proc. Natl. Acad. Sci. 112, 11795 (2015)ADSCrossRefGoogle Scholar
  19. 19.
    Tiwari, A.P., Shin, S., Hwang, E., Jung, S.-G., Park, T., Lee, H.: ArXiv e-prints (2015)Google Scholar
  20. 20.
    Zheng, H., Adrien, A., Hadi, A.-T., Konstantin, T., Mikhail, F., Benjamin, S., Bouchiat, V.: Nat. Phys. 10, 380 (2014)CrossRefGoogle Scholar
  21. 21.
    Camara, N., Huntzinger, J.-R., Rius, G., Tiberj, A., Mestres, N., Pérez-Murano, F., Godignon, P., Camassel, J.: Phys. Rev. B 80, 125410 (2009)ADSCrossRefGoogle Scholar
  22. 22.
    Castro Neto, A.H., Guinea, F., Peres, N.M.R., Novoselov, K.S., Geim, A.K.: Rev. Mod. Phys. 81, 109 (2009)ADSCrossRefGoogle Scholar
  23. 23.
    Michon, A., Vézian, S., Ouerghi, A., Zielinski, M., Chassagne, T., Portail, M.: Appl. Phys. Lett. 97, 171909 (2010)ADSCrossRefGoogle Scholar
  24. 24.
    Jabakhanji, B., Michon, A., Consejo, C., Desrat, W., Portail, M., Tiberj, A., Paillet, M., Zahab, A., Cheynis, F., Lafont, F., Schopfer, F., Poirier, W., Bertran, F., Le Fèvre, P., Taleb-Ibrahimi, A., Kazazis, D., Escoffier, W., Camargo, B.C., Kopelevich, Y., Camassel, J., Jouault, B.: Phys. Rev. B 89, 085422 (2014)ADSCrossRefGoogle Scholar
  25. 25.
    Longobardi, L., Massarotti, D., Rotoli, G., Stornaiuolo, D., Papari, P., Kawakami, A., Pepe, G.P., Barone, A., Tafuri, F.: Phys. Rev. B 84, 184504 (2011)ADSCrossRefGoogle Scholar
  26. 26.
    Speck, F., Jobst, J., Fromm, F., Ostler, M., Waldmann, D., Hundhausen, M., Weber, H.B., Seyller, Th.: Appl. Phys. Lett. 99, 122106 (2011)ADSCrossRefGoogle Scholar
  27. 27.
    Dubos, P., Courtois, H., Pannetier, B., Wilhelm, F.K., Zaikin, A.D., Schön, G.: Phys. Rev. B 63, 064502 (2001)ADSCrossRefGoogle Scholar
  28. 28.
    Calado, V.E., Goswami, S., Nanda, G., Diez, M., Akhmerov, A.R., Watanabe, K., Taniguchi, T., Klapwijk, T.M., Vandersypen, L.M.K.: Nat. Nanotechnol. 10, 761 (2015)ADSCrossRefGoogle Scholar
  29. 29.
    Jeong, D., Choi, J.-H., Lee, G.-H., Jo, S., Doh, Y.-J., Lee, H.-J.: Phys. Rev. B 83, 094503 (2011)ADSCrossRefGoogle Scholar
  30. 30.
    Rosenthal, P.A., Beasley, M.R., Char, K., Colclough, M.S., Zaharchuk, G.: Appl. Phys. Lett. 59, 3482 (1991)ADSCrossRefGoogle Scholar
  31. 31.
    Tafuri, F., Kirtley, J.R.: Rep. Prog. Phys. 68, 2573 (2005)ADSCrossRefGoogle Scholar
  32. 32.
    Arpaia, R., Arzeo, M., Nawaz, S., Charpentier, S., Lombardi, F., Bauch, T.: Appl. Phys. Lett. 104(07), 2014 (2603)Google Scholar
  33. 33.
    Barone, A., Paternò, G.: Physics and applications of the Josephson effect. Wiley (1982)Google Scholar
  34. 34.
    Hart, S., Ren, H., Wagner, T., Leubner, P., Muhlbauer, M., Brune, C., Buhmann, H., Molenkamp, L.W., Yacoby, A.: Nat. Phys. 10, 638 (2014)CrossRefGoogle Scholar
  35. 35.
    Masarotti, D., et al.: to be publishedGoogle Scholar
  36. 36.
    Wu, Y., Yu, V., Lin, M., Low, T., Xia, F., Avouris, P.: Nano Lett. 12, 1417 (2012)ADSCrossRefGoogle Scholar
  37. 37.
    Giovannetti, G., Khomyakov, P.A., Brocks, G., Karpan, V.M., van den Brink, J., Kelly, P.J.: Phys. Rev. Lett. 101, 026803 (2008)ADSCrossRefGoogle Scholar
  38. 38.
    Allen, M.T., Shtanko, O., Fulga, I.C., Wang, J.I.-J., Nurgaliev, D., Watanabe, K., Taniguchi, T., Akhmerov, A.R., Jarillo-Herrero, P., Levitov, L.S., Yacoby, A.: ArXiv e-prints (2015)Google Scholar
  39. 39.
    Ben Shalom, M., Zhu, M.J., Falko, V.I., Mishchenko, A., Kretinin, A.V., Novoselov, K.S., Woods, C.R., Watanabe, K., Taniguchi, T., Geim, A.K., Prance, J.R.: Nat. Phys. (2015)Google Scholar
  40. 40.
    Mizuno, N., Nielsen, B., Xu, D.: Nat. Commun. 4, 2716 (2013)ADSCrossRefGoogle Scholar
  41. 41.
    Baringhaus, J., Ruan, M., Edler, F., Tejeda, A., Sicot, M., Taleb-Ibrahimi, A., Li, A.P., Jiang, Z.G., Conrad, E.H., Berger, C., Tegenkamp, C., de Heer, W.A.: Nature 506, 349 (2014)ADSCrossRefGoogle Scholar
  42. 42.
    Deon, F., Šopić, S., Morpurgo, A.F.: Phys. Rev. Lett. 112, 126803 (2014)ADSCrossRefGoogle Scholar
  43. 43.
    Choi, J.-H., Lee, G.-H., Park, S., Jeong, D., Lee, J.-O., Sim, H.S., Doh, Y.-J., Lee, H.-J.: Nat. Commun. 4, 2525 (2013)ADSGoogle Scholar

Copyright information

© Springer Science+Business Media New York 2016

Authors and Affiliations

  • B. Jouault
    • 1
  • S. Charpentier
    • 2
  • D. Massarotti
    • 3
    • 4
  • A. Michon
    • 5
  • M. Paillet
    • 1
  • J. R. Huntzinger
    • 1
  • A. Tiberj
    • 1
  • A.-A. Zahab
    • 1
  • T. Bauch
    • 2
  • P. Lucignano
    • 4
  • A. Tagliacozzo
    • 4
    • 6
    • 7
  • F. Lombardi
    • 2
  • F. Tafuri
    • 3
    • 4
  1. 1.Laboratoire Charles Coulomb (L2C)UMR 5221 CNRS-Université de MontpellierMontpellierFrance
  2. 2.Chalmers University of TechnologyGöteborgSweden
  3. 3.Dipartimento di Ingegneria Industriale e dell’InformazioneSeconda Universitá di NapoliAversa (CE)Italy
  4. 4.CNR-SPINNapoliItaly
  5. 5.CRHEA - Centre de Recherche sur l’Hétéroépitaxie et ses ApplicationsCNRS, rue Bernard GrégoryValbonneFrance
  6. 6.Dipartimento di FisicaUniversità di Napoli Federico IINapoliItaly
  7. 7.INFN, Laboratori Nazionali di FrascatiFrascatiItaly

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