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Electrical and Dielectric Relaxation Characterization of Ni1−x Zn x Ga0.5Fe1.5O4

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Abstract

The ferrite system, Ni1−x Zn x Ga0.5Fe1.5O4 (x ranges from 0.0 to 0.5 in steps of 0.1), has been synthesized by a solid-state reaction technique. Single-phase cubic spinel structure was confirmed with X-ray diffraction (XRD) and Fourier transform infrared (FT-IR) results. The effect of introducing zinc in the unit cell on the electrical properties was investigated in the ranges 102–105 Hz and 300–600 K of frequency and temperature, respectively. Semiconducting behavior over all studied ranges of frequency and temperature was observed. This behavior is attributed to the cation–anion–cation interaction, which is most predominant at B-sites in these samples. Variation of the universal exponents with temperature indicates the presence of a correlated barrier hopping (CBH) mechanism. The determined transition temperature T C was found to decrease with increasing the compositional parameter x.

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Hashhash, A., Kaiser, M. & Ata-Allah, S.S. Electrical and Dielectric Relaxation Characterization of Ni1−x Zn x Ga0.5Fe1.5O4 . J Supercond Nov Magn 28, 2193–2201 (2015). https://doi.org/10.1007/s10948-015-3012-y

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  • DOI: https://doi.org/10.1007/s10948-015-3012-y

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