Advertisement

Journal of Superconductivity and Novel Magnetism

, Volume 28, Issue 2, pp 391–395 | Cite as

BISCCO Thin Films: Superconducting Phases, Irreversibility Line and Critical Current

  • A. MariñoEmail author
  • H. Sánchez
  • H. Martínez
Original Paper

Abstract

The transport properties such as irreversibility line (IL), critical current density (J c ), and activation energy (E a ) were studied in highly oriented BISCCO thin films with different superconducting phase relations H-2223:L-2212 by ZFC-FC method in the low magnetic field region (less than 0.1 T). The c-axis oriented BISCCO thin films with different superconducting phases H-2223:L-2212, high T c phase (110 K), and low T c phase (80 K), respectively, as determined by x-ray diffraction (XRD), were produced by r.f. magnetron sputtering on MgO (100) substrates and different post-annealing duration times. T i r r (H) data appear to be dominated by the intergrain Josephson flux. They exhibit the behavior of the grain coupling systems (similar to that displayed by spin glasses) and can be well described by a power law behavior like Almeida-Thoules. The irreversibility line (IL), however, was shifted to lower temperatures by decreasing the phase relation. The IL shifting to lower temperatures increases the liquid vortex region and would decrease the critical current density. The critical current density (J c ) and the activation energy (E a ) were determined using the 10 μVolt criterion and from Arrhenius plots of resistance data, respectively. Both decreased by decreasing the phase relation, i.e., by increasing the low T c phase, which can be related to an increase in the granularity of films. The film granularity has been assumed as any crystal lattice defect, which creates a local depression of the superconducting order parameter.

Keywords

BISCCO thin films Defects Irreversibility line Critical current Activation energy 

Notes

Acknowledgements

The authors want to thank the Universidad Nacional de Colombia for financial support.

References

  1. 1.
    Tinkham, M.: Phys. Rev. Lett. 61, 1658 (1988)CrossRefGoogle Scholar
  2. 2.
    Brandt, E.H.: Mod. Int. J. Phys. B 05(05), 751 (1991)CrossRefADSGoogle Scholar
  3. 3.
    Brandt, E.: J. Supercond. 6(4), 201 (1993)CrossRefADSGoogle Scholar
  4. 4.
    Gross, R., Chaudhari, P., Dimos, D., Gupta, A., Koren, G.: Phys. Rev. Lett. 64, 228 (1990)CrossRefADSGoogle Scholar
  5. 5.
    Civale, L., Marwick, A.D., McElfresh, M.W., Worthington, T.K., Malozemoff, A.P., Holtzberg, F.H., Thompson, J.R., Kirk, M.A.: Phys. Rev. Lett. 65, 1164 (1990)CrossRefADSGoogle Scholar
  6. 6.
    Panarina, N., Bukharaev, A., Talanov, Y., Petukhov, V., Gumarov, G., Validov, A., Khasanov, R.: Phys. C. Supercond. 467(1-2), 85 (2007)CrossRefADSGoogle Scholar
  7. 7.
    Shirage, P., Shivagan, D., Crisan, A., Tanaka, Y., Kodama, Y., Kito, H., Iyo, A.: Phys. C 468(7-10), 773 (2008)CrossRefADSGoogle Scholar
  8. 8.
    Kumakura, H., Kitaguchi, H., Togano, K., Maeda, H., Shimoyama, J., Okayasu, S., Kazumata, Y.: Appl. J. Phys. 1 (1993)Google Scholar
  9. 9.
    Clem, J.R.: Phys. Rev. B 43, 7837 (1991)CrossRefADSGoogle Scholar
  10. 10.
    Kim, D., Gray, K., Kampwirth, R., Smith, J., Richeson, D., Marks, T., Kang, J., Talvacchio, J., Eddy, M.: Phys. C 177(4-6), 431 (1991)CrossRefADSGoogle Scholar
  11. 11.
    Kumakura, H., Togano, K., Maeda, H., Kase, J., Morimoto, T.: Appl. Phys. Lett. 58(24) (1991)Google Scholar
  12. 12.
    Yu, S., Okuda, Y., Kawashima, T., Takayama-Muromachi, E.: Jpn. J. Appl. Phys. 35(Part 1, No. 6A), 3378 (1996)CrossRefADSGoogle Scholar
  13. 13.
    Nakane, T., Karppinen, M., Yamauchi, H.: Phys. C 357–360 (0), 226 (2001)CrossRefGoogle Scholar
  14. 14.
    Müller, K., Takashige, M., Bednorz, J.: Phys. Rev. Lett. 58(11), 1143 (1987)CrossRefADSGoogle Scholar
  15. 15.
    Yeshurun, Y., Malozemoff, A.: Phys. Rev. Lett. 60(21), 2202 (1988)CrossRefADSGoogle Scholar
  16. 16.
    Vieira, V., Pureur, P. Schaf, J.: Phys. C 354(14), 299 (2001)CrossRefADSGoogle Scholar
  17. 17.
    Martínez, H., Marino, A., Rodríguez, J.: Physica C 408–410, 568–570 (2004)CrossRefGoogle Scholar
  18. 18.
    Cogollo, R., Marino, A., Sánchez, H., IEEE, T.: Appl. Supercon. 13(2), 2789 (2003)CrossRefGoogle Scholar
  19. 19.
    Palstra, T., Batlogg, á., Van Dover, R., Schneemeyer, L., Waszczak, J.: Phys. Rev. B 41(10), 6621 (1990)CrossRefADSGoogle Scholar

Copyright information

© Springer Science+Business Media New York 2014

Authors and Affiliations

  1. 1.Department of PhysicsUniversidad Nacional de ColombiaBogotáColombia
  2. 2.Department of PhysicsUniversidad de CordobaMonteriaColombia

Personalised recommendations