Abstract
Co-doped zinc oxide thin films (Zn1−xCo x O) have been deposited on c-plane sapphire substrates by dual-beam pulsed laser deposition. The films have lattice parameters similar to that of ZnO, and the lattice parameters are closely distributed. The films grew along a preferred direction, following the epitaxial relationship Zn1− x Co x O (0001)substrate (0001). Excitonic emission was suppressed at higher Co-dopant concentration in ZnO because of increase in the distortion of host lattice and defects. When more Zn is replaced by Co, more impurity levels are developed within the bandgap, and more defect are generated. Under our experimental conditions, the bandgap of the films tends to increase with increasing dopant concentration.
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References
S. J. Pearton, D. P. Norton, K. Ip, Y. W. Heo, and T. Steiner, Prog. Math. Sci. 50, 293 (2004).
J. Gutowski, N. Presser, and I. Broser, Phys. Rev. B 38, 9746 (1988).
X. W. Sun and H. S. Kwok, J. Appl. Phys. 86, 408 (1999).
Y. W. Heo, M. P. Ivill, K. Ip, D. P. Norton, S. J. Pearton, J. G. Kelly, R. Rairigh, A. F. Hebard, and T. Steiner, Appl. Phys. Lett. 84, 2299 (2004).
S. Kolesnik, B. Dabrowski, and J. Mais, J. Appl. Phys. 95, 2582 (2004).
S. J. Peartonl, C. R. Abernathy, D. P. Norton, A. F. Hebard, Y. D. Park, L. A. Boatner, and J. D. Budai, Math. Sci. Eng. R 40, 137 (2003).
T. Dietl, H. Ohno, F. Matsukura, J. Cibert, and D. Ferrand, Science 287, 1019 (2000).
A. Tiwari, C. Jin, A. Kvit, D. Kumar, J. F. Muth, and J. Narayan, Solid State Commun. 121, 371 (2002).
K. Ueda, H. Tabata, and T. Kawai, Appl. Phys. Lett. 79, 988 (2001).
J. H. Park, M. G. Kim, H. M. Jang, S. Ryu, and Y. M. Kim, Appl. Phys. Lett. 84, 1338 (2004).
W. D. Song, M. H. Hong, T. Osipowicz, D. Y. Dai, S. I. Pang, Y. Z. Peng, J. F. Chong, C. W. An, Y. F. Liew, and T. C. Chong, Appl. Phys. A 79, 1349 (2004).
Y. Z. Peng, W. D. Song, C. W. An, J. J. Qiu, J. F. Chong, B. C. Lim, M. H. Hong, T. Liew, and T. C. Chong, Appl. Phys. A 80, 565 (2005).
T. Fukumura, Z. W. Jin, A. Ohtomo, H. Koinuma, and M. Kawassaki, Appl. Phys. Lett. 79, 3366 (1999).
J. H. Kim, H. Kim, D. Kim, Y. E. Ihm, and W. K. Choo, Physica B 327, 304 (2003).
JCPDS – International Center for Diffraction Data powder diffraction file #89-0511.
R. C. Weast, CRC Handbook of Chemistry and Physics (CRC Press, Boca Raton, FL, 1989), p. F-187.
J. F. Moulder, W. F. Stickle, P. E. Sobol, and K. D. Bomben, Handbook of X-ray Photoelectron Spectroscopy (Physical Electronics, Inc., USA, 1995), Chapters 8, 27 and 30.
Guide to using WVASE32 (J. A. Woollam Co., Inc., New York, 2001), Model window 7.
J. I. Pankove, Optical Processes in Semiconductors (Dover Publications Inc., New York, 1975), Chapter 3.
Y.-Z. Yoo, T. Fukumura, Z. W. Jin, K. Hasegawa, M. Kawasaki, P. Ahmet, T. Chikyow, and H. Koinuma, J. Appl. Phys. 90, 4246 (2001).
D. C. Reynolds, D. C. Look, B. Jogai, and H. Morkocb, Solid State Commun. 101, 643 (1997).
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Peng, Y.Z., Liew, T., Song, W.D. et al. Structural and Optical Properties of Co-Doped ZnO Thin Films. J Supercond 18, 97–103 (2005). https://doi.org/10.1007/s10948-005-2158-4
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DOI: https://doi.org/10.1007/s10948-005-2158-4