Abstract
Single crystal X-ray diffraction is applied to elucidate the structures of six tetra-and one penta-siloxane compounds differing in the nature and position of silicon-sitting organic substituents (Me — methyl, Ph — phenyl, mPh — methoxyphenyl, 2mPh — dimethoxyphenyl, 3mPh — trimethoxypehnyl, and C4H6N — butironitrile). Charge states of atoms in the siloxane molecules are calculated, and the effect of oxygen-containing radicals on the Si-O bond lengths and Si-O-Si bond angles affecting the configurations of the tetra-and pentasiloxane cycles is shown.
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Dedicated to the 65th Anniversary of Professor Raphael Tabacchi
Original Russian Text Copyright © 2007 by S. T. Malinovskii, A. Tesuro Vallina, and H. Stoeckli-Evans
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Translated from Zhurnal Strukturnoi Khimii, Vol. 48, No.1, pp.128–136, January–February, 2007.
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Malinovskii, S.T., Tesuro Vallina, A. & Stoeckli-Evans, H. X-ray diffraction investigation of siloxanes. III. Structure and configuration of cyclic tetra-and pentasiloxanes bearing different organic substituents at silicon atoms. J Struct Chem 48, 128–136 (2007). https://doi.org/10.1007/s10947-007-0019-7
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DOI: https://doi.org/10.1007/s10947-007-0019-7