Abstract
Coherent reflection imaging is a new imaging technology allowing X-ray study of upper surface layers of thick and opaque samples or nanostructures and thin samples fixed on a reflecting substrate. We develop the diffraction theory and calculations relevant to coherent reflection imaging of tilted objects illuminated below critical angles of X-ray reflection.
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Artyukov, I.A., Popov, N.L. & Vinogradov, A.V. Simulation of Coherent X-Ray Imaging of Tilted Objects in the Fourier Space. J Russ Laser Res 36, 167–174 (2015). https://doi.org/10.1007/s10946-015-9490-3
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DOI: https://doi.org/10.1007/s10946-015-9490-3