Skip to main content
SpringerLink
Log in

Scanning probe microscope based on matter-wave surface trap

  • Published:
Journal of Russian Laser Research Aims and scope

Abstract

In order to scan nanostructures on a surface, we present a new recurrence tracking microscope based on an atomic trap. An evanescent wave trap is formed by the total internal reflection of two laser fields having different signs of detuning and penetration depths into the vacuum. The microscope employs the quantum recurrence phenomena of trapped atoms. Recurrence times depend on the initial energy of the wave packet in the trap and vary following the nanostructures on the surface under investigation.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. I. Rajapakes and M. Grondine, J. Cell Biol., 192, 711 (2011).

    Article  Google Scholar 

  2. A. B. Churnside, G. M. King, and T. T. Perkins, Opt. Express, 18, 23924 (2010).

    Article  Google Scholar 

  3. G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel, Phys. Rev. Lett., 49, 57 (1982)

    Article  ADS  Google Scholar 

  4. G. H. Binnig and H. Rohrer, IBM J. Res. Develop., 30, 355 (1986).

    Google Scholar 

  5. F. Saif, Phys. Rev. A, 73, 033618 (2006).

    Article  ADS  Google Scholar 

  6. H. Khan and F. Saif, J. Russ. Laser Res, 32, 177 (2011).

    Article  Google Scholar 

  7. Yu. B. Ovchinnikov, S. V. Shulga, and V. I. Balykin, J. Phys. B: At. Mol. Opt. Phys., 24, 3173 (1991).

    Article  ADS  Google Scholar 

  8. J. P. Gordon and A. Ashkin, Phys. Rev. A, 21, 1606 (1980).

    Article  ADS  Google Scholar 

  9. G. Chen, Phys. Lett. A, 326, 55 (2004).

    Article  MathSciNet  ADS  MATH  Google Scholar 

  10. M. Born, Mechanics of the Atom, Ungar, New York (1960).

    Google Scholar 

  11. F. Saif, Phys. Rep., 425, 369 (2006).

    Article  ADS  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Department of Electronics, Quaid-e-Azam University, 45320, Islamabad, Pakistan

    F. Saif & M. Yameen

Authors
  1. F. Saif
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. M. Yameen
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to M. Yameen.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Saif, F., Yameen, M. Scanning probe microscope based on matter-wave surface trap. J Russ Laser Res 33, 490–495 (2012). https://doi.org/10.1007/s10946-012-9306-7

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10946-012-9306-7

Keywords

Search

Navigation