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Residual Stress Profile Assessment by Eddy Current for Shot Peened Nickel Superalloy

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Abstract

Eddy current (EC) measurements have shown promise toward becoming a nondestructive method of residual stress characterization, particularly for nickel-base superalloys. However, previous studies on shot-peened materials have shown apparent discrepancies between directly measured residual stress profiles and those determined from EC data. Here, we report a study of the inter-relationship among electrical conductivity deviation, residual stress and texture of shot peened materials, in order to improve understanding of the piezoresistivity effect that is essential to the on-going efforts to make EC measurements a viable technique for residual stress assessment. Specifically, we develop a macroscopic piezoresistivity theory for polycrystalline materials influenced by texture. The theory was applied to analyze the swept high frequency eddy current data obtained from a shot peened Inconel 718 sample, which was found to exhibit shot-induced texture in the near surface region using X-ray diffraction (XRD) and orientation imaging microscopy (OIM). The residual stress profile of the peened sample was inverted from EC data using a physics model-based approach, and was found to agree with the residual stress profiles measured independently using the standard layer removal XRD technique.

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References

  1. John, R., Larsen, J.M., Buchanan, D.J., Ashbaugh, N.E.: Incorporating residual stresses in life prediction of turbine engine disks. In: Proceedings from NATO RTO (AVT) Symposium on Monitoring and Management of Gas Turbine Fleets for Extended Life and Reduced Costs, Manchester, UK, 8–11 Oct., 2001

  2. Lu, J. (ed.): Handbook of Measurement of Residual Stresses. Fairmont, Upper Saddle River (1996)

    Google Scholar 

  3. Cullity, B.D., Stock, S.R.: Elements of X-Ray Diffraction, 3rd edn. Prentice Hall, Upper Saddle River (2001)

    Google Scholar 

  4. Moore, M.G., Evans, W.P.: SAE Trans. 66, 340 (1958)

    Google Scholar 

  5. American Society for Metals: Metals Handbook, vol. 10, pp. 380–392. Metals Park, Ohio (1986)

    Google Scholar 

  6. Schoenig, F.C., Soules, J.A., Chang, H., Dicillo, J.J.: Mater. Eval. 53, 22 (1995)

    Google Scholar 

  7. Blaszkiewicz, M., Albertin, L., Junker, W.: Mater. Sci. Forum 210–213, 179 (1996)

    Article  Google Scholar 

  8. Chang, H., Schoenig, F.C., Soules, J.A.: Mater. Eval. 57, 1257 (1999)

    Google Scholar 

  9. Zilberstein, V., Fisher, M., Grundy, D., Schlicker, D., Tsukernik, V., Vengrinovich, V., Goldfine, N., Yentzer, T.: ASME J. Press. Vessel Technol. 124, 375 (2002)

    Article  Google Scholar 

  10. Blodgett, M.P., Nagy, P.B.: In: Thompson, D.O., Chimenti, D.E. (eds.) Review of Progress in Quantitative Nondestructive Evaluation 23B. AIP Conference Proceedings, vol. 700, pp. 1216–1223. AIP, Melville (2004)

    Google Scholar 

  11. Blodgett, M.P., Nagy, P.B.: J. Nondestr. Eval. 23, 107 (2004)

    Article  Google Scholar 

  12. Yu, F., Blodgett, M.P., Nagy, P.B.: J. Nondestr. Eval. 25, 17 (2006)

    Google Scholar 

  13. Yu, F., Nagy, P.B.: J. Appl. Phys. 95, 8340 (2004)

    Article  Google Scholar 

  14. Yu, F., Nagy, P.B.: J. Appl. Phys. 96, 1257 (2004)

    Article  Google Scholar 

  15. Yu, F., Blodgett, M.P., Nagy, P.B.: J. Nondestr. Eval. 25, 107 (2006)

    Article  Google Scholar 

  16. Nakagawa, N., Lee, C., Shen, Y.: In: Thompson, D.O., Chimenti, D.E. (eds.) Review of Progress in Quantitative Nondestructive Evaluation, vol. 25, pp. 1418–1424. AIP, Melville (2006)

    Google Scholar 

  17. Lee, C., Shen, Y., Lo, C.C.H., Nakagawa, N.: In: Thompson, D.O., Chimenti, D.E. (eds.) Review of Progress in Quantitative Nondestructive Evaluation, vol. 26. AIP, Melville (2007)

    Google Scholar 

  18. Shen, Y., Lee, C., Lo, C.C.H., Nakagawa, N., Frishman, A.M.: J. Appl. Phys. 101, 014907 (2007)

    Article  Google Scholar 

  19. http://www.rietica.org/

  20. Timoshenko, S.: Theory of Elasticity, 3rd edn. McGraw-Hill, New York (1970)

    MATH  Google Scholar 

  21. Roe, R.J.: J. Appl. Phys. 37, 2069 (1966)

    Article  Google Scholar 

  22. Roe, R.J.: J. Appl. Phys. 36, 2024 (1965)

    Article  Google Scholar 

  23. Roe, R.J.: J. Chem. Phys. 40, 2608 (1964)

    Article  Google Scholar 

  24. Nye, J.F.: Physical Properties of Crystals, Their Representation by Tensors and Matrices. Clarendon, Oxford (1957)

    MATH  Google Scholar 

  25. Bunge, H.J.: Z. Met.kd. 56, 872 (1965)

    Google Scholar 

  26. Bunge, H.J.: Texture Analysis in Materials Science: Mathematical Methods. Butterworths, London (1982). Translated by P.R. Morris

    Google Scholar 

  27. Thompson, R.B., Smith, J.F., Lee, S.S., Johnson, G.G.: Metall. Trans. A 20A, 2431 (1989)

    Google Scholar 

  28. Thompson, R.B.: Mater. Eval. 51, 1162–1165, 1173 (1993)

    Google Scholar 

  29. Thompson, R.B.: In: Birnbaum, G., Auld, B.A. (eds.) Sensing for Materials Characterization, Processing, and Manufacturing, pp. 23–45. American Society for Nondestructive Testing, Inc., 1998

  30. Cheng, C.C., Dodd, C.V., Deeds, W.E.: Int. J. Nondestr. Test. 3, 109 (1971)

    Google Scholar 

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Shen, Y., Lo, C.C.H., Nakagawa, N. et al. Residual Stress Profile Assessment by Eddy Current for Shot Peened Nickel Superalloy. J Nondestruct Eval 29, 1–13 (2010). https://doi.org/10.1007/s10921-009-0060-x

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  • DOI: https://doi.org/10.1007/s10921-009-0060-x

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