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Tuning of Critical Temperature and Aging Effect of Ti Films For Superconducting Transition-Edge Sensors

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Abstract

Superconducting transition-edge sensors (TESs) are widely used to detect electromagnetic radiation ranging from millimeter wave to γ-ray photons. The energy resolution of TESs is mainly determined by their critical temperature (TC). We propose to tune the TC of Ti film by baking in air for a period at a moderate temperature and find that TC is inversely proportional to the logarithm of baking time (tbaking) for a given baking temperature (Tbaking), but scales with the square of Tbaking for a given tbaking. Ti film covered by a thin Au protection layer follows the same trend when baked in air. Based on the XPS analysis, we attribute the change in TC of Ti films to the oxidation at the surface and diffusion of oxygen into the films. In addition, the aging effect of Ti films is similar to that of baking in air but with much slower change rate.

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Acknowledgements

This work is supported partly by NSFC under Grants 12293032, 120101002, 12173097, the National Key R&D Program of China under Grant 2020YFC2201703.

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Authors and Affiliations

  1. Purple Mountain Observatory, Chinese Academy of Sciences, Nanjing, 210023, China

    W. Zhang, Z. Wang, P. Z. Li, J. Q. Zhong, Q. X. Ma, Z. F. Feng, K. M. Zhou, W. Miao, Y. Ren, Q. J. Yao, J. Li & S. C. Shi

  2. University of Science and Technology of China, Hefei, 230026, China

    Q. X. Ma & Z. F. Feng

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  1. W. Zhang
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W. Zhang wrote the main manuscript text, all authors reviewed the manuscript.

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Correspondence to W. Zhang.

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Zhang, W., Wang, Z., Li, P.Z. et al. Tuning of Critical Temperature and Aging Effect of Ti Films For Superconducting Transition-Edge Sensors. J Low Temp Phys 214, 106–112 (2024). https://doi.org/10.1007/s10909-023-03017-6

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  • DOI: https://doi.org/10.1007/s10909-023-03017-6

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