Abstract
We report on self-aligned Ti TES single-photon detectors embedded in a 1550 nm optical cavity. The circular TES chip is shaped with a dry-etch process from the backside to protect the TES and wiring from possible damage and aligned to a single-mode fiber using a standard fiber ferrule and a matching sleeve. The critical temperature of Ti film is about 300 mK, resulting in a relatively short time constant of 1.3 μs. By choosing an active area of 15 × 15 μm2, our optical Ti TES can distinguish single photons at 1550 nm and reaches a system photon detection efficiency of 55% and an energy resolution of about 0.7 eV.
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Acknowledgements
This work is supported partly by the National Key R&D Program of China under Grant 2017YFA0304003, NSFC under Grants U1831202, U1731119, U1931123, 11773083, and 11873099, CAS under Grants QYZDJ-SSW-SLH043 and GJJSTD20180003, Jiangsu Province under Grant BRA2020411.
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Li, P.Z., Geng, Y., Zhang, W. et al. Development of Self-aligned Ti Optical Transition-Edge Sensors at 1550 nm. J Low Temp Phys 209, 248–255 (2022). https://doi.org/10.1007/s10909-022-02887-6
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DOI: https://doi.org/10.1007/s10909-022-02887-6