Skip to main content

Advertisement

SpringerLink
Log in

Measurement of Residual Stress in YBa2Cu3O7−x Thin Films by Raman Spectroscopy

  • Published:
Journal of Low Temperature Physics Aims and scope Submit manuscript

Abstract

In this paper, we reported a different approach to measure residual stress state in YBa2Cu3O7−x (YBCO) films using Raman spectroscopy. YBCO thin films with the thicknesses of approximately 500 nm were synthesized on LaAlO3 (LAO) and SrTiO3 (STO) substrates using the Trifluoroacetate-organometallic deposition technology (TFA-MOD). A linear relationship was observed between the Raman peak shift and residual stress. Moreover, it was noted that, as for free-standing YBCO and YBCO thin film, a linear relationship was obtained between the Raman peak shift \(\Delta \omega\), the residual stress σ, and the stress factor k = 179.3 (cm Mpa), i.e., \(\sigma = 179.3 \times \Delta \omega \,(Mpa)\). It is found that this method allowed the residual stress of YBCO thin films to be directly measured using the Raman shift factor. This test method can be used for the rapid and non-destructive detection of residual stress in YBCO films.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Fig. 1
Fig. 2
Fig. 3
Fig. 4
Fig. 5
Fig. 6
Fig. 7

Similar content being viewed by others

References

  1. D. Larbalestier, A. Gurevich, D.M. Feldmann, A. Polyanskii, High-Tc superconducting materials for electric power applications. Nature 414(6861), 368–377 (2001)

    Article  ADS  Google Scholar 

  2. A.B. Abrahamsen, N. Mijatovic, E. Seiler, T. Zirngibl, C. Træholt, P.B. Nørgård et al., Superconducting wind turbine generators. Supercond. Sci. Technol. 23(3), 034019 (2010)

    Article  ADS  Google Scholar 

  3. G. Kaltsas, A.G. Nassiopoulou, M. Siakavellas, E. Anastassakis, Stress effect on suspended polycrystalline silicon membranes fabricated by micromachining of porous silicon. Sens. Actuators A Phys. 68(1), 429–434 (2015)

    Google Scholar 

  4. I.D. Wolf, Micro-raman spectroscopy to study local mechanical stress in silicon integrated circuits. Semicond. Sci. Technol. 11(2), 139 (1999)

    Article  Google Scholar 

  5. E. Anastassakis, A. Cantarero, M. Cardona, Piezo-raman measurements and anharmonic parameters in silicon and diamond. Phys. Rev. B Condens. Matter 41(11), 7529 (1990)

    Article  ADS  Google Scholar 

  6. Z. Lei, Y. Kang, M. Hu, Y. Qiu, H. Xu, H. Niu, An experimental analysis of residual stress measurements in porous silicon using micro-Raman spectroscopy. Chin. Phys. Lett. 21(2), 403–405 (2004)

    Article  ADS  Google Scholar 

  7. I.D. Wolf, Stress measurements in si microelectronics devices using Raman spectroscopy. J. Raman Spectrosc. 30(10), 877–883 (1999)

    Article  ADS  Google Scholar 

  8. K. Suzuki, T. Araki, T. Konno, T. Suzuki, I. Hirabayashi, Y. Enomoto, Microwave characteristics and Jc, distribution of TFA-MOD YBCO film. Phys. C Supercond. Appl. 372–376(12), 623–625 (2002)

    Article  ADS  Google Scholar 

  9. L. Zeng, Y.M. Lu, Z.Y. Liu, C.Z. Chen, B. Gao, C.B. Cai, Surface texture and interior residual stress variation induced by thickness of YBa2Cu3O7-δ thin films. J. Appl. Phys. 112(5), 189 (2012)

    Article  Google Scholar 

  10. Y. Wang, D. Xu, Y. Li, L. Liu, Dependencies of microstructure and stress on the thickness of GdBa2Cu3O7-δ thin films fabricated by rf sputtering. Nanoscale Res. Lett. 8(1), 304 (2013)

    Article  ADS  Google Scholar 

  11. J. Xiong, W. Qin, X. Cui, B. Tao, J. Tang, Y. Li, Thickness-induced residual stresses in textured YBCO thin films determined by crystalline group method. Phys. C Supercond. Appl. 455(1–2), 52–57 (2007)

    Article  ADS  Google Scholar 

  12. M. Becker, G. Sarau, H.P. Strunk, S. Christiansen, Raman Imaging of Grain Orientation, Strain, Crystallinity and Doping Levels in Solar Silicon. Raman Imaging, vol. 168 (Springer, Berlin, 2012), pp. 257–299

    Google Scholar 

  13. Z. Wu, J. Zhou, W. Chen, J. Shen, C. Lv, Effects of residual stress on the electrical properties in PbZr0.52Ti0.48O3, thin films. J. Sol-Gel Sci. Technol. 75(3), 1–6 (2015)

    Article  Google Scholar 

  14. H. Miyagawa, D. Kamiya, C. Sato, K. Ikegami, Strain measurement for Raman-inactive substrates with pbo thin films using raman coating method. J. Mater. Sci. 34(1), 105–110 (1999)

    Article  ADS  Google Scholar 

  15. J.L. Fang, Y. Wu, The principle and application of surface enhanced Raman spectroscopy (SERS) (in Chinese). Surf. Technol. 23(4), 167–173 (1994)

    Google Scholar 

  16. M. Qiu, W.G. Mao, C.Y. Dai, Y.C. Zhou, Micro-Raman spectroscopy technique applications to measure stress fields in thermal barrier coatings (in Chinese). J. Changsha Commun. Univ. 22(2), 76–80 (2006)

    Google Scholar 

  17. P. Jannotti, G. Subhash, Measurement of residual stresses in B4C–SiC–Si Ceramics Using Raman Spectroscopy, in Conference on Experimental and Applied Mechanics (2016)

  18. H.D. Wagner, M.S. Amer, L.S. Schadler, Residual compression stress profile in high-modulus carbon fiber embedded in isotactic polypropylene by micro-Raman spectroscopy. Appl. Compos. Mater. 7(4), 209–217 (2000)

    Article  ADS  Google Scholar 

  19. T. Tomimatsu, Y. Kagawa, S.J. Zhu, Residual stress distribution in electron beam-physical vapor deposited ZrO2, thermal barrier coating layer by Raman spectroscopy. Metall. Mater. Trans. A 34(8), 1739–1741 (2003)

    Article  Google Scholar 

  20. W. Feng, N. Watanabe, H. Shimamoto, M. Aoyagi, K. Kikuchi, Residual stress investigation of via-last through-silicon via by polarized Raman spectroscopy measurement and finite element simulation. Jpn. J. Appl. Phys. 57, 07MF02 (2018)

    Article  Google Scholar 

  21. J.H. Cheon, P.S. Shankar, J.P. Singh, Influence of processing methods on residual stress evolution in coated conductors. Supercond. Sci. Technol. 18(1), 142 (2005)

    Article  ADS  Google Scholar 

  22. S. Degoy, J. Jiménez, P. Martin, O. Martinez, A.C. Prieto, D. Chambonnet et al., Oxygen content of YBaCuO thin films. Phys. C Supercond. 256(3), 291–297 (1996)

    Article  ADS  Google Scholar 

  23. P.C. Mcintyre, M.J. Cima, F.N. Man, Metalorganic deposition of high-Jc Ba2YCu3O7−x thin films from trifluoroacetate precursors onto (100) SrTiO3. J. Appl. Phys. 68(8), 4183–4187 (1990)

    Article  ADS  Google Scholar 

  24. Y. Yeshurun, A.P. Malozemoff, Giant flux creep and irreversibility in an Y–Ba–Cu–O crystal: an alternative to the superconducting-glass model. Phys. Rev. Lett. 60(21), 2202–2205 (1988)

    Article  ADS  Google Scholar 

  25. J. Xiong, W. Qin, X. Cui et al., High-resolution XRD study of stress-modulated YBCO films with various thicknesses. J. Cryst. Growth 300(2), 364–367 (2007)

    Article  ADS  Google Scholar 

Download references

Acknowledgements

This work was supported by the Research and Innovation Project of Graduate Students in Hunan (No. CX2017B284) and partially supported by the National Natural Science Foundation of China (Contract No. 50606027).

Author information

Authors and Affiliations

  1. Key Laboratory of Low Dimensional Materials and Application Technology of Ministry of Education, School of Materials Science and Engineering, Xiangtan University, Xiangtan, 411105, China

    Peng Zhao & Xiaoping Ouyang

  2. Systems Engineering Research Institute, China State Shipbuilding Corporation Limited, Beijing, 100094, China

    Jingfeng Yu & Haisheng Xu

  3. Key Laboratory of Micro-nano Measurement, Manipulation and Physics, Ministry of Education, Beihang University, Beijing, 100191, China

    Sansheng Wang & Fang Li

Authors
  1. Peng Zhao
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Xiaoping Ouyang
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Jingfeng Yu
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. Haisheng Xu
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. Sansheng Wang
    View author publications

    You can also search for this author in PubMed Google Scholar

  6. Fang Li
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Peng Zhao.

Additional information

Publisher's Note

Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Zhao, P., Ouyang, X., Yu, J. et al. Measurement of Residual Stress in YBa2Cu3O7−x Thin Films by Raman Spectroscopy. J Low Temp Phys 202, 382–396 (2021). https://doi.org/10.1007/s10909-020-02549-5

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10909-020-02549-5

Keywords

Search

Navigation