Skip to main content
SpringerLink
Log in

On-Wafer Cryogenic Characterization Technique of an SIS-Based Frequency Up and Down Converter

  • Published:
Journal of Low Temperature Physics Aims and scope Submit manuscript

Abstract

This paper describes an on-wafer characterization system and calibration technique for frequency up and down converters based on a superconductor–insulator–superconductor (SIS) tunnel junction. The measurement system uses a 4-K probe station in combination with a vector network analyzer which allows measurement of both up- and down-conversion gains and reflection coefficients. We employed and verified a scalar mixer calibration technique for accurate characterization of the conversion properties. We present the detailed measurement technique and verification using an SIS frequency converter sample.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Figure 1
Figure 2
Figure 3
Figure 4

Similar content being viewed by others

References

  1. Y. Uzawa et al., J. Low Temp. Phys. 193(3–4), 512–517 (2018)

    Article  ADS  Google Scholar 

  2. G. de Lange, J. Low Temp. Phys. 176(3–4), 408–413 (2014)

    ADS  Google Scholar 

  3. T. Kojima et al., AIP Adv. 8(2), 025206 (2018)

    Article  ADS  Google Scholar 

  4. T. Kojima et al., IEEE Trans. Appl. Supercond. 27(4), 9000704 (2017)

    Article  Google Scholar 

  5. Keysight Technologies, Application Note. https://literature.cdn.keysight.com/litweb/pdf/5989-1420EN.pdf. Accessed July 2019

  6. Keysight Technologies, Cal Plane Manager. http://na.support.keysight.com/pna/help/latest/S3_Cals/Cal_Plane_Manager.htm. Accessed July 2019

  7. T. Kojima et al., IEEE Trans. Appl. Supercond. 29(5), 1103304 (2019)

    Article  Google Scholar 

Download references

Acknowledgements

This work was supported by JSPS KAKENHI under Grants JP19H02205 and JP18H03881. The authors would like to thank Tomonori Tamura for fabrication of the SIS junction.

Author information

Authors and Affiliations

  1. National Astronomical Observatory of Japan, Mitaka, Japan

    Takafumi Kojima, Yoshinori Uzawa & Wenlei Shan

  2. Graduate University for Advanced Studies (SOKENDAI), Mitaka, Japan

    Takafumi Kojima, Yoshinori Uzawa & Wenlei Shan

  3. The University of Electro-Communications, Chofu, Japan

    Yuto Kozuki

Authors
  1. Takafumi Kojima
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Yoshinori Uzawa
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Wenlei Shan
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. Yuto Kozuki
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Takafumi Kojima.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Kojima, T., Uzawa, Y., Shan, W. et al. On-Wafer Cryogenic Characterization Technique of an SIS-Based Frequency Up and Down Converter. J Low Temp Phys 199, 219–224 (2020). https://doi.org/10.1007/s10909-020-02414-5

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10909-020-02414-5

Keywords

Search

Navigation